Abstract: Heat sink and heat sink arrangements are provided for an electronic device immersed in a liquid coolant. A heat sink may comprise: a base for mounting on top of a heat-transmitting surface of the electronic device and transferring heat from the heat-transmitting surface; and a retaining wall extending from the base and defining a volume. A heat sink may have a wall arrangement to define a volume, in which the electronic device is mounted. A heat sink may be for an electronic device to be mounted on a surface in a container, in an orientation that is substantially perpendicular to a floor of the container. Heat is transferred from the electronic device to liquid coolant held in the heat sink volume. A cooling module comprising a heat sink is also provided. A nozzle arrangement may direct liquid coolant to a base of the heat sink.

Abstract: A monitoring apparatus and method includes a monitor, a sensor comprising a wireless connection with the monitor, and an adapter comprising the wireless connection with the monitor and a wired or wireless connection with a remote monitoring station. The monitor is designed to wirelessly pair with the sensor and/or the adapter when being only positioned by a user in a closed proximity to the sensor and/or the adapter or in a direct contact with the sensor and/or the adapter and without an additional action by the user and/or a wired connection between the monitor and the sensor and/or the adapter. A pairing alignment mark may be provided on each of the monitor, sensor and adapter.

Abstract: The present invention relates to techniques, including methods and devices, for optical technology. In particular, the present invention provides methods, devices, and structures for optical devices, and in particular, photo diodes, commonly called photo sensors.

Abstract: According to the present disclosure, techniques related to manufacturing and applications of power photodiode structures and devices based on group-III metal nitride and gallium-based substrates are provided. More specifically, embodiments of the disclosure include techniques for fabricating photodiode devices comprising one or more of GaN, AlN, InN, InGaN, AlGaN, and AlInGaN, structures and devices. Such structures or devices can be used for a variety of applications including optoelectronic devices, photodiodes, power-over-fiber receivers, and others.

Abstract: Systems and methods are provided for. One embodiment is a system that includes an interface configured to receive an image of media printed on with print data, and memory configured to store defect reference data of nozzles belonging to printheads of a printer. The system also includes a print defect controller configured to detect a nozzle defect in the image based on a comparison of the image with the print data, and to determine a type of the nozzle defect based on a comparison of the nozzle defect with the defect reference data.

Abstract: Systems and methods are provided for. One embodiment is a system that includes an interface configured to receive an image of media printed on with print data, and memory configured to store defect reference data of nozzles belonging to printheads of a printer. The system also includes a print defect controller configured to detect a nozzle defect in the image based on a comparison of the image with the print data, and to determine a type of the nozzle defect based on a comparison of the nozzle defect with the defect reference data.

Abstract: Systems and methods are provided for print review systems. One embodiment is a print review system that includes a memory that stores inspection parameters of print media marked by a printer, an interface that communicates with the printer, and a controller that, in response to the printer initiating processing of a print job, receives an indication via the interface of settings used by the printer in processing the print job, modifies the parameters based on the settings, inspects the print media based on the modified parameters, and reports compliance of the print job with the modified parameters.

Abstract: Systems and methods are provided for reviewing printed jobs. One embodiment is a system that includes a print review device. The print review device includes a memory that stores data which indicates whether regions along a width of print media marked by a printer are flagged as bypassable, and a controller configured to determine printhead conditions within regions that have not been flagged, associate each printhead condition with a corresponding region, and to generate a report with notifications of printhead conditions within each region that has not been flagged, while foregoing determination of printhead conditions in regions that have been flagged.

Abstract: Systems and methods are provided for reviewing printed jobs. One embodiment is a system that includes a print review device. The print review device includes a memory that stores data which indicates whether regions along a width of print media marked by a printer are flagged as bypassable, and a controller configured to determine printhead conditions along the width of the print media, associate each printhead condition with a corresponding region, and to generate a report with notifications of printhead conditions within each region that has not been flagged, while suppressing notifications of printhead conditions within regions that have been flagged.

Abstract: Systems and methods are provided for reviewing printed jobs. On embodiment is a system comprising a print review device. The print review device includes a memory that stores an image of a test pattern printed by printheads of a printer, and a controller that generates a Graphical User Interface (GUI), for presentation at a display, depicting states of the printheads based on the image, receives input from a user selecting one of the printheads, correlates the printhead with a portion of the image, and presents the portion of the image for review at the GUI. The controller also identifies locations on the portion that are correlated with nozzles of the printhead, and selectively highlights the locations based on state information for the nozzles.

Abstract: Systems and methods are provided for adaptive printhead cleaning. One embodiment is a printer maintenance system that includes memory to store defect information of a group of nozzles of a printer, and a processor to determine whether the group of nozzles have a number of nozzle defects that exceeds a threshold based on the defect information. In response to a determination that the threshold is exceeded, the processor determines a type of cleaning operation, a cleaning duration, and a cleaning intensity to perform for the group of nozzles based on the defect information. The processor then initiates a cleaning operation for the group of nozzles according to the type of cleaning operation, the cleaning duration, and the cleaning intensity determined for the group of nozzles.

Abstract: A printing system is disclosed. The printing system includes at least one physical memory device to store uniformity compensation logic and one or more processors coupled with the at least one physical memory device to execute the uniformity compensation logic to receive print image measurement data corresponding with each of a plurality of pel forming elements, generate a first set of intermediate images based on the print image measurement data, determine whether historical sets of intermediate images are available, generate first transfer functions corresponding to each of the pel forming elements based on the first set of intermediate images and the historical sets of intermediate images upon a determination that the historical sets of intermediate images are available and transmit the first transfer functions for each of the pel forming elements.

Abstract: Systems and methods are provided for. One embodiment is a system that includes an interface configured to receive an image of media printed on with print data, and memory configured to store defect reference data of nozzles belonging to printheads of a printer. The system also includes a print defect controller configured to detect a nozzle defect in the image based on a comparison of the image with the print data, and to determine a type of the nozzle defect based on a comparison of the nozzle defect with the defect reference data.

Abstract: Systems and methods are provided for adaptive printhead cleaning. One embodiment is a printer maintenance system that includes memory to store defect information of a group of nozzles of a printer, and a processor to determine whether the group of nozzles have a number of nozzle defects that exceeds a threshold based on the defect information. In response to a determination that the threshold is exceeded, the processor determines a type of cleaning operation, a cleaning duration, and a cleaning intensity to perform for the group of nozzles based on the defect information. The processor then initiates a cleaning operation for the group of nozzles according to the type of cleaning operation, the cleaning duration, and the cleaning intensity determined for the group of nozzles.

Abstract: A method of improving high-current density efficiency of an LED, said method comprising: (a) preparing a series of LEDs having decreasing defect densities, wherein each LED of said series has a peak IQE of at least 50%, and wherein each LED of said series has the same epitaxial structure; (b) determining an increase in IQEs at high-current density between at least two LEDs of said series; (c) preparing at least an additional LED of said series by reducing defect density relative to the previously obtained lowest defect density; and (d) reiterating steps (b) and (c) until said increase is at least 3% between two LEDs of said series having a decrease X in defect densities.

Abstract: A method of improving high-current density efficiency of an LED, said method comprising: (a) preparing a series of LEDs having decreasing defect densities, wherein each LED of said series has a peak IQE of at least 50%, and wherein each LED of said series has the same epitaxial structure; (b) determining an increase in IQEs at high-current density between at least two LEDs of said series; (c) preparing at least an additional LED of said series by reducing defect density relative to the previously obtained lowest defect density; and (d) reiterating steps (b) and (c) until said increase is at least 3% between two LEDs of said series having a decrease X in defect densities.

Abstract: A method of forming a III-Nitride based device comprising: (a) depositing first layers by MOCVD on a substrate, wherein the first layers comprise device layers of III-Nitride material; and (b) depositing epitaxial second layers over the first layers by at least one of sputtering, plasma deposition, pulsed laser deposition, or liquid phase epitaxy, wherein the second layers comprise III-Nitride material and define at least partially a tunnel junction.

Abstract: A method of forming a HI-Nitride based device comprising: (a) depositing first layers by MOCVD on a substrate, wherein the first layers comprise device layers of III-Nitride material; and (b) depositing epitaxial second layers over the first layers by at least one of sputtering, plasma deposition, pulsed laser deposition, or liquid phase epitaxy, wherein the second layers comprise III-Nitride material and define at least partially a tunnel junction.

Abstract: A two part wire receptacle for receiving wire being laid therein by a flier in a coiled pattern is disclosed. The first part is permanent wire receiving basket has a relatively flat surface with a plurality of upstanding inner wire guide elements defining the inner periphery of the coil and a further plurality of upstanding outer wire guides defining the outer periphery of the coil. Another form of the first part may be embodied in a machine for receiving and packaging wire being laid therein in a coiled pattern. In the machine, a permanent wire receiving basket has a relatively flat surface, a plurality of upstanding inner wire guide elements defining the inner periphery of the coil, and an upstanding generally cylindrical outer wire guide defining the outer periphery of the coil.