Abstract: Systems and methods of performing a stress measurement of a chemically strengthened glass using a light-scattering polarimetry system include adjusting the intensity of a light beam from a light source in an illumination system using a rotatable half-wave plate and a first polarizer operably disposed between the light source and a rotating light diffuser that has a rotation time tR. The first polarizer is aligned with a second polarizer in a downstream optical compensator to have matching polarization directions by rotating the rotatable half-wave plate to a position where the exposure time tE falls within an exposure range tR?tE. The method also includes performing an exposure using the exposure time tE to obtain the stress measurement. One or both of the half-wave plate and first polarizer can be tilted to avoid deleterious back-reflected light from entering the light source.

Abstract: The hybrid measurement system includes an evanescent prism coupling spectroscopy (EPCS) sub-system and a light-scattering polarimetry (LSP) sub-system. The EPCS sub-system includes an EPCS light source system optically coupled to an EPCS detector system through an EPCS coupling prism. The LSP sub-system includes an LSP light source optically coupled to an optical compensator, which in turn is optically coupled to a LSP detector system via a LSP coupling prism. A support structure supports the EPCS and LSP coupling prisms to define a coupling prism assembly, which supports the two prisms at a measurement location. Stress measurements made using the EPCS and LSP sub-systems are combined to fully characterize the stress properties of a transparent chemically strengthened substrate. Methods of processing the EPCS and LSP measurements and enhanced configurations of the EPCS and LPS sub-systems to improve measurement accuracy are also disclosed.

Abstract: Methods and apparatus for obtaining a corrected digital mode spectrum for a chemically strengthened (CS) substrate having a curved surface are disclosed. The methods include digitally capturing transverse magnetic (TM) and transverse electric (TE) mode spectra of the CS substrate to form a digital mode spectrum image using an evanescent prism coupling system having a system calibration for measuring flat CS substrates. The method further includes establishing a calibration correction based on the difference in the digitally captured TM and TE mode spectra as compared to a reference TM and TE mode spectra for a reference CS substrate. The calibration correction is applied to the digital mode spectrum image to form the corrected digital mode spectrum image, which can be processed using the system calibration for measuring flat CS substrates to determine a refractive index profile and stress characteristics for the curved CS substrate.

Abstract: A prism coupling system configured to determine at least one stress characteristic in a chemically strengthened substrate having a surface and a near-surface waveguide has a a light source system that generates measurement light. A coupling prism provides optical coupling of the measurement light into and out of the near-surface waveguide over an optical path that comprises a low-angle region and a high-angle region. A detector system arranged to receive the measurement light from the coupling prism to detect a mode spectrum image. A light-blocking member is operably disposed to at least partially extend into the low-angle region without extending into the high-angle region to increase or optimize the contrast of the mode spectrum image.

Abstract: Systems and methods of performing a stress measurement of a chemically strengthened glass using a light-scattering polarimetry system include adjusting the intensity of a light beam from a light source in an illumination system using a rotatable half-wave plate and a first polarizer operably disposed between the light source and a rotating light diffuser that has a rotation time tR. The first polarizer is aligned with a second polarizer in a downstream optical compensator to have matching polarization directions by rotating the rotatable half-wave plate to a position where the exposure time tE falls within an exposure range tR?tE. The method also includes performing an exposure using the exposure time tE to obtain the stress measurement. One or both of the half-wave plate and first polarizer can be tilted to avoid deleterious back-reflected light from entering the light source.

Abstract: The hybrid measurement system includes an evanescent prism coupling spectroscopy (EPCS) sub-system and a light-scattering polarimetry (LSP) sub-system. The EPCS sub-system includes an EPCS light source system optically coupled to an EPCS detector system through an EPCS coupling prism. The LSP sub-system includes an LSP light source optically coupled to an optical compensator, which in turn is optically coupled to a LSP detector system via a LSP coupling prism. A support structure supports the EPCS and LSP coupling prisms to define a coupling prism assembly, which supports the two prisms at a measurement location. Stress measurements made using the EPCS and LSP sub-systems are combined to fully characterize the stress properties of a transparent chemically strengthened substrate. Methods of processing the EPCS and LSP measurements and enhanced configurations of the EPCS and LPS sub-systems to improve measurement accuracy are also disclosed.

Abstract: The hybrid measurement system includes an evanescent prism coupling spectroscopy (EPCS) sub-system and a light-scattering polarimetry (LSP) sub-system. The EPCS sub-system includes an EPCS light source optically coupled to an EPCS detector system through an EPCS coupling prism. The LSP sub-system includes an LSP light source optically coupled to an optical compensator, which in turn is optically coupled to a LSP detector system via a LSP coupling prism. A support structure supports the EPCS and LSP coupling prisms to define a coupling prism assembly, which supports the two prisms at a measurement location. Stress measurements made using the EPCS and LSP sub-systems are combined to fully characterize the stress properties of a transparent chemically strengthened substrate. Methods of processing the EPCS and LSP measurements to improve measurement accuracy are also disclosed.

Abstract: Disclosed herein are light guide plates (100, 100?, 100?) comprising a transparent substrate (110) having an edge surface (150), a light emitting first major surface (160), and an opposing second major surface (170); and a polymeric film (120) disposed on at least one of the first (160) and second (170) major surfaces of the transparent substrate, wherein the polymeric film (120) comprises a plurality of microstructures (130) and/or a plurality of light extraction features. At least one light source (140) may be coupled to the edge surface (150) of the transparent substrate (110). Display and lighting devices comprising such light guide plates are further disclosed, as well as methods for manufacturing such light guide plates.

Abstract: The prism-coupling systems and methods include using a prism-coupling system to collect initial TM and TE mode spectra of a chemically strengthened article having a refractive index profile with a near-surface spike region and a deep region. The prism-coupling system has a light source configured to generate sequential measurement light beams or reflected light beams having different measurement wavelengths. The different measurement wavelengths generate different TM and TE mode spectra. The light source can include multiple light-emitting elements and optical filters or a broadband light source and optical filters. The optical filters can be sequentially inserted into either the input optical path or the output optical path of the prism-coupling system.

Abstract: The hybrid measurement system includes an evanescent prism coupling spectroscopy (EPCS) sub-system and a light-scattering polarimetry (LSP) sub-system. The EPCS sub-system includes an EPCS light source optically coupled to an EPCS detector system through an EPCS coupling prism. The LSP sub-system includes an LSP light source optically coupled to an optical compensator, which in turn is optically coupled to a LSP detector system via a LSP coupling prism. A support structure supports the EPCS and LSP coupling prisms to define a coupling prism assembly, which supports the two prisms at a measurement location. Stress measurements made using the EPCS and LSP sub-systems are combined to fully characterize the stress properties of a transparent chemically strengthened substrate. Methods of processing the EPCS and LSP measurements to improve measurement accuracy are also disclosed.

Abstract: A laminate structure is provided that allows the surface renewal and rework of a device by the selective removal of layers of the laminate. The selective removal may be achieved by heating or irradiating the laminate structure, such that an adhesive layer debonds and allows the removal of a damaged layer to provide a pristine surface.

Abstract: Disclosed herein are light guide plates (100, 100?, 100?) comprising a transparent substrate (110) having an edge surface in (150), a light emitting first major surface (160), and an opposing second major surface (170); and a polymeric film (120) disposed on at least one of the first (160) and second (170) major surfaces of the transparent substrate, wherein the polymeric film (120) comprises a plurality of microstructures (130) and/or a plurality of light extraction features. At least one light source (140) may be coupled to the edge surface (150) of the transparent substrate (110). Display and lighting devices comprising such light guide plates are further disclosed, as well as methods for manufacturing such light guide plates.

Abstract: Embodiments of the present disclosure relate generally to methods of forming a laminate structure. In one or more embodiments, the method includes situating an interlayer between a glass substrate and a non-glass substrate having a softening point to form an assembled stack, heating the assembled stack to a temperature in a range of greater than the Tg of the interlayer to less than the softening point of the non-glass substrate and applying a force to at least one of the laminate glass surface and the laminate non-glass surface to bond that counter-balances thermal stress and polymer cure forces during bonding and prevents warpage, distortion and breakage of the laminate. In some embodiments, the interlayer has a coefficient of thermal expansion (CTE) at least 10 times greater than the CTE of the glass substrate.

Abstract: A contoured glass sheet laminating system may include a glass-side vacuum bed, a laminate-side vacuum bed and a lamination actuator. The glass-side vacuum bed may include a vacuum backside and a mold-receiving side and may have sufficient permeability to permit a vacuum system to pull a vacuum across a thickness of the glass-side vacuum bed between the vacuum backside and the mold-receiving side of the glass-side vacuum bed. The laminate-side vacuum bed may include a vacuum backside and a thin-film loading side and may have sufficient permeability to permit a vacuum system to pull a vacuum across a thickness of the laminate-side vacuum bed between the vacuum backside and the thin-film loading side of the of the laminate-side vacuum bed.

Abstract: A contoured glass sheet laminating system may include a glass-side vacuum bed, a laminate-side vacuum bed and a lamination actuator. The glass-side vacuum bed may include a vacuum backside and a mold-receiving side and may have sufficient permeability to permit a vacuum system to pull a vacuum across a thickness of the glass-side vacuum bed between the vacuum backside and the mold-receiving side of the glass-side vacuum bed. The laminate-side vacuum bed may include a vacuum backside and a thin-film loading side and may have sufficient permeability to permit a vacuum system to pull a vacuum across a thickness of the laminate-side vacuum bed between the vacuum backside and the thin-film loading side of the of the laminate-side vacuum bed.