Abstract: A powered circuit, such as a sensor circuit that is configured to be affixed to a power distribution cable in a grain bin temperature and humidity sensing system, is subject to electrostatic discharge (ESD) events. The circuit described herein provides a discharge path that advantageously diverts charge in an ESD event to the power bus ground while protecting internal components in the powered circuit from ESD damage. A probe circuit has an ESD probe that is located proximate to an aperture in a circuit housing cover. The probe circuit is connected to the input power bus ground. An isolation circuit coupled to the input power bus isolates circuit board power and ground from the power and ground supplied by the power bus. The isolation circuit includes a resistor serving as a component of a low-impedance power loop. A limiting component limits the voltage experienced by the powered circuit.

Abstract: A system for correcting network planning data includes a planning repository containing information related to network traffic, network element locations and network element connectivity. The system further includes a repository that includes a plurality of call data records. In addition, the system includes an information processing system including a processor and a memory device coupled to the processor. The memory device contains a set of instructions that, when executed by the processor, cause the processor to receive location data associated with a wireless network cell from a plurality of devices connected to the wireless network. The set of instructions further causes the processor to identify call data records associated with the received location data and to compare information in the received location data with corresponding information stored in the identified call data records to identify errors in the information stored in the planning repository.

Abstract: Methods and computer software products are provided for predicting nucleic acid hybridization affinity. In one embodiment, hybridization intensity (I) is determined using the equation: I = exp ? [ ? i ? P i ? S i ] where Pi is the value of the ith parameter and Si is a value derived from the sequence of the probe. The methods and software products of the invention may be used for enhancing mutation detection, probe selection and probe array manufacturing quality control.