Patents by Inventor Nathaniel R. Bogan

Nathaniel R. Bogan has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20240135583
    Abstract: A system and method for scoring trained probes for use in analyzing one or more candidate poses of a runtime image is provided. A set of probes with location and gradient direction based on a trained model are applied to one or more candidate poses based upon a runtime image. The applied probes each respectively include a discrete set of position offsets with respect to the gradient direction thereof. A match score is computed for each of the probes, which includes estimating a best match position for each of the probes respectively relative to one of the offsets thereof, and generating a set of individual probe scores for each of the probes, respectively at the estimated best match position.
    Type: Application
    Filed: June 11, 2023
    Publication date: April 25, 2024
    Inventor: Nathaniel R. Bogan
  • Patent number: 11676301
    Abstract: A system and method for scoring trained probes for use in analyzing one or more candidate poses of a runtime image is provided. A set of probes with location and gradient direction based on a trained model are applied to one or more candidate poses based upon a runtime image. The applied probes each respectively include a discrete set of position offsets with respect to the gradient direction thereof. A match score is computed for each of the probes, which includes estimating a best match position for each of the probes respectively relative to one of the offsets thereof, and generating a set of individual probe scores for each of the probes, respectively at the estimated best match position.
    Type: Grant
    Filed: September 7, 2020
    Date of Patent: June 13, 2023
    Assignee: Cognex Corporation
    Inventor: Nathaniel R. Bogan
  • Patent number: 11562505
    Abstract: This invention provides a system and method for displaying color match information on an acquired image of an object. A model/pattern having a plurality of color test points at locations of stable color is provided. A display process generates visible geometric shapes with respect to the color test points in a predetermined color. An alignment process aligns features of the object with respect to features on the model so that the geometric shapes appear in locations on the object that correspond to locations on the model. The geometric shapes can comprise closed shapes that surround a region expected to be stable color on the object. Such shapes can define circles, squares, diamonds or any other acceptable closed or open shape that is visible to the user on the display.
    Type: Grant
    Filed: March 9, 2019
    Date of Patent: January 24, 2023
    Assignee: Cognex Corporation
    Inventors: Jason Davis, Zihan Hans Liu, Nathaniel R. Bogan
  • Publication number: 20210090230
    Abstract: A system and method for scoring trained probes for use in analyzing one or more candidate poses of a runtime image is provided. A set of probes with location and gradient direction based on a trained model are applied to one or more candidate poses based upon a runtime image. The applied probes each respectively include a discrete set of position offsets with respect to the gradient direction thereof. A match score is computed for each of the probes, which includes estimating a best match position for each of the probes respectively relative to one of the offsets thereof, and generating a set of individual probe scores for each of the probes, respectively at the estimated best match position.
    Type: Application
    Filed: September 7, 2020
    Publication date: March 25, 2021
    Inventor: Nathaniel R. Bogan
  • Patent number: 10769776
    Abstract: A system and method for scoring trained probes for use in analyzing one or more candidate poses of a runtime image is provided. A set of probes with location and gradient direction based on a trained model are applied to one or more candidate poses based upon a runtime image. The applied probes each respectively include a discrete set of position offsets with respect to the gradient direction thereof. A match score is computed for each of the probes, which includes estimating a best match position for each of the probes respectively relative to one of the offsets thereof, and generating a set of individual probe scores for each of the probes, respectively at the estimated best match position.
    Type: Grant
    Filed: February 10, 2017
    Date of Patent: September 8, 2020
    Assignee: Cognex Corporation
    Inventor: Nathaniel R. Bogan
  • Publication number: 20200074685
    Abstract: This invention provides a system and method for displaying color match information on an acquired image of an object. A model/pattern having a plurality of color test points at locations of stable color is provided. A display process generates visible geometric shapes with respect to the color test points in a predetermined color. An alignment process aligns features of the object with respect to features on the model so that the geometric shapes appear in locations on the object that correspond to locations on the model. The geometric shapes can comprise closed shapes that surround a region expected to be stable color on the object. Such shapes can define circles, squares, diamonds or any other acceptable closed or open shape that is visible to the user on the display.
    Type: Application
    Filed: March 9, 2019
    Publication date: March 5, 2020
    Inventors: Jason Davis, Zihan Hans Liu, Nathaniel R. Bogan
  • Patent number: 10192283
    Abstract: This invention provides a system and method for determining the level of clutter in an image in a manner that is rapid, and that allows a scoring process to quickly determine whether an image is above or below an acceptable level of clutter—for example to determine if the underlying imaged runtime object surface is defective without need to perform a more in-depth analysis of the features of the image. The system and method employs clutter test points that are associated with regions on the image that should contain a low gradient magnitude, indicative of emptiness. This enables the runtime image to be analyzed quickly by mapping trained clutter test points at locations in the coordinate space in which lack of emptiness indicates clutter, and if detected, can rapidly indicate differences and/or defects that allow for the subject of the image to be accepted or rejected without further image analysis.
    Type: Grant
    Filed: December 22, 2014
    Date of Patent: January 29, 2019
    Assignee: COGNEX CORPORATION
    Inventors: Jason Davis, David J. Michael, Nathaniel R. Bogan
  • Publication number: 20170236263
    Abstract: A system and method for scoring trained probes for use in analyzing one or more candidate poses of a runtime image is provided. A set of probes with location and gradient direction based on a trained model are applied to one or more candidate poses based upon a runtime image. The applied probes each respectively include a discrete set of position offsets with respect to the gradient direction thereof. A match score is computed for each of the probes, which includes estimating a best match position for each of the probes respectively relative to one of the offsets thereof, and generating a set of individual probe scores for each of the probes, respectively at the estimated best match position.
    Type: Application
    Filed: February 10, 2017
    Publication date: August 17, 2017
    Inventor: Nathaniel R. Bogan
  • Publication number: 20160180198
    Abstract: This invention provides a system and method for determining the level of clutter in an image in a manner that is rapid, and that allows a scoring process to quickly determine whether an image is above or below an acceptable level of clutter—for example to determine if the underlying imaged runtime object surface is defective without need to perform a more in-depth analysis of the features of the image. The system and method employs clutter test points that are associated with regions on the image that should contain a low gradient magnitude, indicative of emptiness. This enables the runtime image to be analyzed quickly by mapping trained clutter test points at locations in the coordinate space in which lack of emptiness indicates clutter, and if detected, can rapidly indicate differences and/or defects that allow for the subject of the image to be accepted or rejected without further image analysis.
    Type: Application
    Filed: December 22, 2014
    Publication date: June 23, 2016
    Inventors: Jason Davis, David J. Michael, Nathaniel R. Bogan