Patents by Inventor Nathaniel See

Nathaniel See has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11937020
    Abstract: An object inspection system and a method for detecting defects which utilizes a plurality of cameras and lights to capture images of a portion of an object and which uses the captured images to determine the presence of a defect upon a surface, such as surface, of the object and which may communicated the location of the identified defect to an automated defect repair assembly.
    Type: Grant
    Filed: March 16, 2022
    Date of Patent: March 19, 2024
    Assignee: Inovision Software Solutions, Inc.
    Inventors: Jacob Nathaniel Allen, Zhipeng Liang, Brandon David See, Frank Damacio Luna
  • Publication number: 20220383121
    Abstract: A method of inducing sparsity for outputs of neural network layer may include receiving outputs from a layer of a neural network; partitioning the outputs into a plurality of partitions; identifying first partitions in the plurality of partitions that can be treated as having zero values; generating an encoding that identifies locations of the first partitions among remaining second partitions in the plurality of partitions; and sending the encoding and the second partitions to a subsequent layer in the neural network.
    Type: Application
    Filed: May 25, 2021
    Publication date: December 1, 2022
    Applicant: Applied Materials, Inc.
    Inventors: Tameesh Suri, Bor-Chau Juang, Nathaniel See, Bilal Shafi Sheikh, Naveed Zaman, Myron Shak, Sachin Dangayach, Udaykumar Diliprao Hanmante