Patents by Inventor Natsuki KOHAMA

Natsuki KOHAMA has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11231414
    Abstract: To provide magnetic composite particles which can be separated from a sample solution in a short period of time using magnetism, and furthermore, have an excellent dispersion stability in the sample solution, which are magnetic composite particles in which an outer shell is formed on surfaces of core particles containing an inorganic oxide or a polymer, wherein the outer shell comprises magnetic nanoparticles and a silicon compound, the value of the volume average particle diameter (dTEM) of the magnetic composite particles measured by a transmission electron microscope is 30 nm or more to 210 nm or less, and the value of (dDLS)/(dTEM) which is the ratio of the value of the particle diameter (dDLS) of the particles measured by a dynamic light scattering method and the value of the volume average particle diameter (dTEM) is 2.0 or less.
    Type: Grant
    Filed: August 31, 2017
    Date of Patent: January 25, 2022
    Assignees: TOHOKU UNIVERSITY, DOWA ELECTRONICS MATERIALS CO., LTD.
    Inventors: Daisuke Nagao, Mikio Konno, Haruyuki Ishii, Kumiko Hayashi, Natsuki Kohama, Takayuki Yoshida, Toshihiko Ueyama
  • Publication number: 20190271694
    Abstract: To provide magnetic composite particles which can be separated from a sample solution in a short period of time using magnetism, and furthermore, have an excellent dispersion stability in the sample solution, which are magnetic composite particles in which an outer shell is formed on surfaces of core particles containing an inorganic oxide or a polymer, wherein the outer shell comprises magnetic nanoparticles and a silicon compound, the value of the volume average particle diameter (dTEM) of the magnetic composite particles measured by a transmission electron microscope is 30 nm or more to 210 nm or less, and the value of (dDLS)/(dTEM) which is the ratio of the value of the particle diameter (dDLS) of the particles measured by a dynamic light scattering method and the value of the volume average particle diameter (dTEM) is 2.0 or less.
    Type: Application
    Filed: August 31, 2017
    Publication date: September 5, 2019
    Applicants: TOHOKU UNIVERSITY, DOWA ELECTRONICS MATERIALS CO., LTD.
    Inventors: Daisuke NAGAO, Mikio KONNO, Haruyuki ISHII, Kumiko HAYASHI, Natsuki KOHAMA, Takayuki YOSHIDA, Toshihiko UEYAMA