Patents by Inventor Natsumi HAYASHI

Natsumi HAYASHI has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Near-infrared absorbing composition, near-infrared absorbing film, and image sensor for solid-state imaging element
    Patent number: 11971563
    Abstract: Disclosed is a near-infrared absorbing composition, including: a near-infrared absorbing agent; and a solvent, wherein the near-infrared absorbing agent includes at least one of the following Component (A) and Component (B): Component (A): a component composed of a compound having a structure of the following general formula (I) and a metal ion; Component (B): a component composed of a metal complex that is obtainable by a reaction of the compound having the structure of the following general formula (I) and a metal compound.
    Type: Grant
    Filed: March 11, 2019
    Date of Patent: April 30, 2024
    Assignee: KONICA MINOLTA, INC.
    Inventors: Koji Daifuku, Yosuke Mizutani, Natsumi Itamoto, Keigo Tamaki, Yutaro Horie, Kenji Hayashi, Issei Nakahara, Takahiko Nojima, Kiyoshi Fukusaka
  • Particle measurement device, three-dimensional shape measurement device, prober device, particle measurement system, and particle measurement method
    Patent number: 11940463
    Abstract: The particle measurement device includes: an acquiring unit configured to acquire pad surface shape data indicating a surface shape of an electrode pad including a probe needle mark where a probe needle has contacted; a roughness calculating unit configured to calculate volume of a recessed portion recessed from a pad reference surface and volume of a protruding portion protruding from the pad reference surface based on the pad surface shape data; and a particle quantity calculating unit configured to calculate a particle quantity from a volume difference between the volume of the recessed portion and the volume of the protruding portion.
    Type: Grant
    Filed: August 31, 2023
    Date of Patent: March 26, 2024
    Assignee: TOKYO SEIMITSU CO., LTD.
    Inventors: Natsumi Hayashi, Hideki Morii, Tetsuo Yoshida, Toshiyuki Kimura
  • PARTICLE MEASUREMENT DEVICE, THREE-DIMENSIONAL SHAPE MEASUREMENT DEVICE, PROBER DEVICE, PARTICLE MEASUREMENT SYSTEM, AND PARTICLE MEASUREMENT METHOD
    Publication number: 20230417797
    Abstract: The particle measurement device includes: an acquiring unit configured to acquire pad surface shape data indicating a surface shape of an electrode pad including a probe needle mark where a probe needle has contacted; a roughness calculating unit configured to calculate volume of a recessed portion recessed from a pad reference surface and volume of a protruding portion protruding from the pad reference surface based on the pad surface shape data; and a particle quantity calculating unit configured to calculate a particle quantity from a volume difference between the volume of the recessed portion and the volume of the protruding portion.
    Type: Application
    Filed: August 31, 2023
    Publication date: December 28, 2023
    Applicant: Tokyo Seimitsu Co., Ltd.
    Inventors: Natsumi HAYASHI, Hideki MORII, Tetsuo YOSHIDA, Toshiyuki KIMURA