Abstract: An apparatus, die, and method can be used form a ribbon from a melt, where capillaries are relatively short and spacers are relatively long as compared to a die opening. Such a configuration can cause the melt to flow is a transverse direction that is substantially parallel to the solid/liquid interface to help move impurities to desired locations. In a particular embodiment, a crystal ribbon can be formed where defects, such as microvoids and impurities, are at higher concentrations near outer edges of the crystal ribbon. The outer edges can be removed to produce crystal substrates that are substantially free of microvoids and have no or a relatively low concentration of impurities. In another particular embodiment, the transverse flow can also help to increase the crystal growth rate.

Abstract: A glitch free controlled ring oscillator may comprise a programmable delay chain connected to a gating and inverter stage or means. A latch or latching means may be provided between the delay chain and the gating and inverter stage or means for registering the clock state at the time of disabling the oscillator and setting the output of the oscillator to the registered clock state.

Abstract: An on-chip timing measurement circuit for improving skew measurement and timing parameter characterization in integrated logic circuits providing increased accuracy and range. The measurement circuit includes a chip delay element characterization circuit for determining chip specific delay values having one output connected to a second control input of the programmable delay generator and receiving an output from the programmable delay generator for providing a value corresponding to the measured chip specific delay element timing, the characterization circuit being enabled by a control signal from the analyzer during a setup phase of the measurement cycle thereby enhancing the accuracy of the measurement for both skew measurement and timing parameter characterization.

Abstract: A glitch free controlled ring oscillator may comprise a programmable delay chain connected to a gating and inverter stage or means. A latch or latching means may be provided between the delay chain and the gating and inverter stage or means for registering the clock state at the time of disabling the oscillator and setting the output of the oscillator to the registered clock state.

Abstract: An on-chip timing measurement circuit for improving skew measurement and timing parameter characterization in integrated logic circuits providing increased accuracy and range. The measurement circuit includes a chip delay element characterization circuit for determining chip specific delay values having one output connected to a second control input of the programmable delay generator and receiving an output from the programmable delay generator for providing a value corresponding to the measured chip specific delay element timing, the characterization circuit being enabled by a control signal from the analyzer during a setup phase of the measurement cycle thereby enhancing the accuracy of the measurement for both skew measurement and timing parameter characterization.