Abstract: A method and apparatus suitable for built in self test (BIST) of analog-to-digital converters (ADCs) and digital-to-analog converters (DACs) embedded in a mixed-signal integrated circuit, and high precision converters. Deterministic test patterns, such as a binary count, are applied to the DAC, and via the DAC directly to the ADC or via an analog circuit to be tested in the test mode. The testing is performed digitally via the digital-analog-digital path, is compatible with conventional digital test, and requires minimal additional circuitry to implement. The output response of the ADC is accumulated into four or more signatures which individually represent a number of parameters including offset, gain, second harmonic distortion, third harmonic distortion, and differential non-linearity.