Abstract: A system, method, and apparatus for allocating game pieces selected in a game of chance based on performance in a skill exercise, is disclosed. In one embodiment, the apparatus is a computing device such as a computer, mobile device, server, etc. that has a processor coupled to a an input/output device and to a memory, wherein the memory and processor implement a method of ranking, allocating, and distributing game pieces in a game of chance by: ranking a strength of each of the initial blind set of one or more game pieces; conducting a skill exercise amongst the players; ranking the players' input from the skill exercise; allocating the initial blind set to each player based on each player's performance on the skill exercise; distributing the initial blind set of one or more game pieces based on the allocating operation; and continuing with the game of chance.

Abstract: An optical wavelength meter for measuring wavelength of an optical beam includes two periodic out of phase fine optical filters (44, 45), using, for example Fabry Perot etalon filters, Fizeau filters, fibre Bragg gratings or photonic crystals. The phases of the periodic responses are arranged such that a peak (5109 or trough (511) of one response coincides with a slope (522) of the other response so that a slope portion of a response may always be chosen for measurement. A coarse filter (43) is provided to unambiguously define on which cycle of the periodic response of the fine filters a measured wavelength lies. Synchronized clock signals are provided to measure output of the filters using, for example, photodiodes (421, 422, 423, 424), at a rate of (1,000 to 10,000) wavelength measurements per second.

Abstract: A tuneable multi-section semiconductor laser 100 is characterized by applying currents in step-wise increments to sections 101, 102, 103 of the laser respectively and measuring power output by the laser to determine values of the applied currents corresponding to stable operating conditions for which the laser emits radiation at wavelengths remote from mode boundaries 51, 52; 141, 142 of the laser. The wavelength of the emitted radiation is measured and variations in the applied currents required to cross a mode boundary such that the laser undergoes a mode jump to emit radiation at a significantly different wavelength are also measured. These values are stored in a look-up table for use of the laser under the characterizing conditions and state of ageing of the laser. The applied currents are changed, to cause a predetermined incremental change in wavelength of the emitted radiation, within the said mode boundaries, and the further values are also stored.

Abstract: An optical wavelength meter for measuring wavelength of an optical beam includes two periodic out of phase fine optical filters (44, 45), using, for example Fabry Perot etalon filters, Fizeau filters, fibre Bragg gratings or photonic crystals. The phases of the periodic responses are arranged such that a peak (5109 or trough (511) of one response coincides with a slope (522) of the other response so that a slope portion of a response may always be chosen for measurement. A coarse filter (43) is provided to unambiguously define on which cycle of the periodic response of the fine filters a measured wavelength lies. Synchronized clock signals are provided to measure output of the filters using, for example, photodiodes (421, 422, 423, 424), at a rate of (1,000 to 10,000) wavelength measurements per second.

Abstract: A method is described for qualifying a multisection semiconductor laser using measurements of excursions from stable operating conditions to neighbouring mode boundaries at which the laser undergoes mode-hopping. These excursions are measured when the laser is characterised to provide a measure of the stability and hence the quality of the laser, and to facilitate statisctical analysis of the quality of a batch of lasers from a given wafer. The values of the excursions may be re-measured during the life of the laser using a curtailed version of the characterising procedure rapidly to monitor aging or other deterioration of the laser.