Abstract: Systems and methods for sample analysis include applying, using a first laser source, a first beam to a sample to desorb organic material from a location of the sample and ionizing the desorbed organic material using a second laser source to generate ionized organic material. The ionized organic material is then analyzed using a mass spectrometer. A second beam from the first laser is then applied to the sample to ablate inorganic material from the location of the sample. The ablated inorganic material is then ionized using the second laser source to generate ionized inorganic material. The mass spectrometer is then used to analyze the ionized inorganic material. During analysis, one or more images of the sample may also be captured and linked to the collected analysis data.

Abstract: Systems and methods for sample analysis include applying, using a first laser source, a first beam to a sample to desorb organic material from a location of the sample and ionizing the desorbed organic material using a second laser source to generate ionized organic material. The ionized organic material is then analyzed using a mass spectrometer. A second beam from the first laser is then applied to the sample to ablate inorganic material from the location of the sample. The ablated inorganic material is then ionized using the second laser source to generate ionized inorganic material. The mass spectrometer is then used to analyze the ionized inorganic material. During analysis, one or more images of the sample may also be captured and linked to the collected analysis data.

Abstract: Systems and methods for sample analysis include applying, using a first laser source, a first beam to a sample to desorb organic material from a location of the sample and ionizing the desorbed organic material using a second laser source to generate ionized organic material. The ionized organic material is then analyzed using a mass spectrometer. A second beam from the first laser is then applied to the sample to ablate inorganic material from the location of the sample. The ablated inorganic material is then ionized using the second laser source to generate ionized inorganic material. The mass spectrometer is then used to analyze the ionized inorganic material. During analysis, one or more images of the sample may also be captured and linked to the collected analysis data.

Abstract: Systems and methods for sample analysis include applying, using a first laser source, a first beam to a sample to desorb organic material from a location of the sample and ionizing the desorbed organic material using a second laser source to generate ionized organic material. The ionized organic material is then analyzed using a mass spectrometer. A second beam from the first laser is then applied to the sample to ablate inorganic material from the location of the sample. The ablated inorganic material is then ionized using the second laser source to generate ionized inorganic material. The mass spectrometer is then used to analyze the ionized inorganic material. During analysis, one or more images of the sample may also be captured and linked to the collected analysis data.

Abstract: A strain sensor assembly is configured to detect one or more of forces applied to a structure having a recess. The strain sensor can include at least a pair of opposed strain gauge members that extend from the support member. Each strain gauge member defines a support portion carried by the support member and a biasing portion. The support portion includes at least one strain gauge sensor. The biasing portion is configured to bias against a wall of the recess of the structure when the strain sensor assembly is disposed in the recess. The strain sensor assembly is configured such that the at least a pair of strain gauge members form an interference fit with the wall of the recess when the strain sensor assembly is inserted in the recess.

Abstract: A strain sensor assembly is configured to detect one or more of forces applied to a structure having a recess. The strain sensor can include at least a pair of opposed strain gauge members that extend from the support member. Each strain gauge member defines a support portion carried by the support member and a biasing portion. The support portion includes at least one strain gauge sensor. The biasing portion is configured to bias against a wall of the recess of the structure when the strain sensor assembly is disposed in the recess. The strain sensor assembly is configured such that the at least a pair of strain gauge members form an interference fit with the wall of the recess when the strain sensor assembly is inserted in the recess.

Abstract: A device detecting tension in synthetic rigging in a sailboat. A deadeye used in rigging has an opening therein containing a strain gauge module. The strain gauge module is positioned between one end of the deadeye and lashing eyelets. Different strain gauge module substrate configurations are used. A transmitter module is coupled to the strain gauge module for wirelessly transmitting signals representative of the rigging load or tension. The strain gauge module is easily removable for repair or replacement.