Abstract: An electronic device comprises a plurality of integrated circuit dies mounted on different areas of a carrier. The carrier is folded into a plurality of layers, each layer comprising one of the different areas of the carrier and one of the integrated circuit dies, such that the plurality of integrated circuit dies form a stack. Adjacent surfaces of neighboring layers are fixed together, for example by an adhesive layer, and the folded carrier and the integrated circuit dies are embedded in a molded material.

Abstract: A method of optimizing cross current in class D amplifiers and simultaneously minimizing the harmonic distortion is provided. The method overcomes the problem of using the limited speed voltage comparators often used in cross current preventing circuits. Method embodiments are based on introducing a replica amplifier with a current sensor matched to a main amplifier. The duration of a sensed cross current within the replica amplifier is compared by a current comparator with a small enough reference current. The comparator output generates a pulse with a duration equal to the duration of the cross current event in the replica amplifier. The duration of that pulse is measured and used to generate a dead time pulse for blanking amplifier pre-driver inputs.

Abstract: An electronic device comprises a plurality of integrated circuit dies mounted on different areas of a carrier. The carrier is folded into a plurality of layers, each layer comprising one of the different areas of the carrier and one of the integrated circuit dies, such that the plurality of integrated circuit dies form a stack. Adjacent surfaces of neighbouring layers are fixed together, for example by an adhesive layer, and the folded carrier and the integrated circuit dies are embedded in a moulded material.

Abstract: A method of optimising cross current in class D amplifiers and simultaneously minimizing the harmonic distortion is provided. The method overcomes the problem of using the limited speed voltage comparators often used in cross current preventing circuits. Method embodiments are based on introducing a replica amplifier with a current sensor matched to a main amplifier. The duration of a sensed cross current within the replica amplifier is compared by a current comparator with a small enough reference current. The comparator output generates a pulse with a duration equal to the duration of the cross current event in the replica amplifier. The duration of that pulse is measured and used to generate a dead time pulse for blanking amplifier pre-driver inputs.