Abstract: A method for calibrating a fully-differential input system may include determining a first voltage of a first node of the fully-differential input system, wherein the first node is coupled at the first node to a plurality of first resistors in a first star configuration, determining a second voltage of a second node of the fully-differential input system, wherein the second node is coupled at the second node to a plurality of second resistors in a second star configuration, each resistor of the plurality of second resistors corresponding to a respective resistor of the plurality of first resistors, and trimming individual resistances of the plurality of first resistors and the plurality of second resistors in order to maintain a difference of a first voltage at the first node and a second voltage of the second node at approximately zero.

Abstract: A system may include an integrated circuit comprising an on-chip power supply and an internal power rail, a gate-controlled supply switch configured to be coupled between the on-chip power supply and an external power supply such that the internal power rail is regulated by the on-chip power supply when the gate-controlled supply switch is open and the internal power rail is regulated by the external power supply when the gate-controlled supply switch is closed, and a control circuit configured to monitor conditions associated with the on-chip power supply when the gate-controlled supply switch is transitioning between switch states and based on the conditions, control a rate of charging or discharging of a capacitance coupled to a gate of the gate-controlled supply switch.