Patents by Inventor Neeraj Kumar Jha

Neeraj Kumar Jha has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Methodology for bias temperature instability test
    Patent number: 7759962
    Abstract: A method for performing a bias temperature instability test on a device includes performing a first stress on the device. After the first stress, a first measurement is performed to determine a first parameter of the device. After the first measurement, a second stress is performed on the device, wherein only the first parameter is measured between the first stress and the second stress. The method further includes performing a second measurement to determine a second parameter of the device after the second stress. The second parameter is different from the first parameter.
    Type: Grant
    Filed: October 16, 2008
    Date of Patent: July 20, 2010
    Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
    Inventors: Jiaw-Ren Shih, Neeraj Kumar Jha, Rakesh Ranjan, Naresh Kumar Emani
  • Methodology for Bias Temperature Instability Test
    Publication number: 20100097091
    Abstract: A method for performing a bias temperature instability test on a device includes performing a first stress on the device. After the first stress, a first measurement is performed to determine a first parameter of the device. After the first measurement, a second stress is performed on the device, wherein only the first parameter is measured between the first stress and the second stress. The method further includes performing a second measurement to determine a second parameter of the device after the second stress. The second parameter is different from the first parameter.
    Type: Application
    Filed: October 16, 2008
    Publication date: April 22, 2010
    Inventors: Jiaw-Ren Shih, Neeraj Kumar Jha, Rakesh Ranjan, Naresh Kumar Emani