Patents by Inventor Neeraj Nagpal

Neeraj Nagpal has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20240272629
    Abstract: Methods, systems, and apparatus, including computer programs encoded on a computer storage medium, for optimizing material processing. In one aspect, a method includes collecting, from a set of sensors, a set of current manufacturing conditions. Based on the set of current manufacturing conditions collected from the sensors, a set of current qualities of a material currently being processed by manufacturing equipment is determined. A baseline production measure for processing the material according to the set of current qualities is obtained. A candidate set of manufacturing conditions that provide an improved production measure relative to the baseline production measure is determined. A set of candidate qualities for the material produced under the candidate set of manufacturing conditions is determined. A visualization that presents both of the set of candidate qualities of the material and the set of current qualities of the material currently being processed is generated.
    Type: Application
    Filed: April 16, 2024
    Publication date: August 15, 2024
    Inventors: Neeraj Nagpal, Peter Antensteiner
  • Publication number: 20230273608
    Abstract: Methods, systems, and apparatus, including computer programs encoded on a computer storage medium, for optimizing material processing. In one aspect, a method includes collecting, from a set of sensors, a set of current manufacturing conditions. Based on the set of current manufacturing conditions collected from the sensors, a set of current qualities of a material currently being processed by manufacturing equipment is determined. A baseline production measure for processing the material according to the set of current qualities is obtained. A candidate set of manufacturing conditions that provide an improved production measure relative to the baseline production measure is determined. A set of candidate qualities for the material produced under the candidate set of manufacturing conditions is determined. A visualization that presents both of the set of candidate qualities of the material and the set of current qualities of the material currently being processed is generated.
    Type: Application
    Filed: May 5, 2023
    Publication date: August 31, 2023
    Inventors: Neeraj Nagpal, Peter Antensteiner
  • Patent number: 11681280
    Abstract: Methods, systems, and apparatus, including computer programs encoded on a computer storage medium, for optimizing material processing. In one aspect, a method includes collecting, from a set of sensors, a set of current manufacturing conditions. Based on the set of current manufacturing conditions collected from the sensors, a set of current qualities of a material currently being processed by manufacturing equipment is determined. A baseline production measure for processing the material according to the set of current qualities is obtained. A candidate set of manufacturing conditions that provide an improved production measure relative to the baseline production measure is determined. A set of candidate qualities for the material produced under the candidate set of manufacturing conditions is determined. A visualization that presents both of the set of candidate qualities of the material and the set of current qualities of the material currently being processed is generated.
    Type: Grant
    Filed: December 11, 2019
    Date of Patent: June 20, 2023
    Assignee: Andritz Inc.
    Inventors: Neeraj Nagpal, Peter Antensteiner
  • Publication number: 20200209839
    Abstract: Methods, systems, and apparatus, including computer programs encoded on a computer storage medium, for optimizing material processing. In one aspect, a method includes collecting, from a set of sensors, a set of current manufacturing conditions. Based on the set of current manufacturing conditions collected from the sensors, a set of current qualities of a material currently being processed by manufacturing equipment is determined. A baseline production measure for processing the material according to the set of current qualities is obtained. A candidate set of manufacturing conditions that provide an improved production measure relative to the baseline production measure is determined. A set of candidate qualities for the material produced under the candidate set of manufacturing conditions is determined. A visualization that presents both of the set of candidate qualities of the material and the set of current qualities of the material currently being processed is generated.
    Type: Application
    Filed: December 11, 2019
    Publication date: July 2, 2020
    Inventors: Neeraj Nagpal, Peter Antensteiner
  • Publication number: 20110005008
    Abstract: A method of finishing a textile comprising the steps of: (a) preparing an aqueous finishing liquor comprising from 0.05 wt. % solids to 65 wt.
    Type: Application
    Filed: April 15, 2010
    Publication date: January 13, 2011
    Inventors: Harrie P. Schoots, Neeraj Nagpal, Dalia I. Eicken, Vinh V. Nguyen, Jennifer S. Kauffman
  • Patent number: D916890
    Type: Grant
    Filed: December 31, 2018
    Date of Patent: April 20, 2021
    Assignee: Andritz Inc.
    Inventors: Neeraj Nagpal, Peter Antensteiner