Patents by Inventor Neil Judell

Neil Judell has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20160285568
    Abstract: A system suitable for use in classifying radio signals includes a plurality of feature extractors configured to extract a plurality of features from an object and a plurality of classification layers. Each of the plurality of classification layers includes one or more reduced enhanced Gaussian classifiers selected from a plurality of Gaussian classifiers based on a classification error rate of each of the plurality of Gaussian classifiers and configured to classify the object as belonging to an object class in a subgroup of correctly classified object classes or in a disjoint error subgroup that needs further classification, using at least one of the extracted plurality of features. If the object is classified as belonging to an object class in a disjoint error subgroup at a layer, the object is passed on to a different reduced enhanced Gaussian classifier in a next layer for further classification.
    Type: Application
    Filed: November 4, 2015
    Publication date: September 29, 2016
    Applicant: DRS ICAS, LLC
    Inventor: Neil Judell
  • Patent number: 9110033
    Abstract: A surface inspection system, as well as related components and methods, are provided. The surface inspection system includes a beam source subsystem, a beam scanning subsystem, a workpiece movement subsystem, an optical collection and detection subsystem, and a processing subsystem. The optical collection and detection system features, in the front quartersphere, a light channel assembly for collecting light reflected from the surface of the workpiece, and a front collector and wing collectors for collecting light scattered from the surface, to greatly improve the measurement capabilities of the system. The light channel assembly has a switchable edge exclusion mask and a reflected light detection system for improved detection of the reflected light.
    Type: Grant
    Filed: September 30, 2009
    Date of Patent: August 18, 2015
    Assignee: KLA-Tencor Corporation
    Inventors: Richard E. Bills, Neil Judell, Klaus R. Freischlad, James P. McNiven
  • Patent number: 9103800
    Abstract: A method for inspecting a surface of a workpiece for asymmetric defects, by scanning an incident beam on the surface of the workpiece to impinge thereon to create reflected light extending along a light channel axis in a front quartersphere and scattered light, the incident beam and the light channel axis defining an incident plane, collecting the scattered light at a plurality of collectors disposed above the surface at defined locations such that scatter from asymmetric defects is collectable by at least one collector, detecting collector output and generating signals in response, and processing the signals associated with each collector individually to obtain information about asymmetric defects.
    Type: Grant
    Filed: July 29, 2013
    Date of Patent: August 11, 2015
    Assignee: KLA-Tencor Corporation
    Inventors: Richard E. Bills, Neil Judell, Timothy R. Tiemeyer, James P. McNiven
  • Publication number: 20150042987
    Abstract: A surface inspection system, as well as related components and methods, are provided. The surface inspection system includes a beam source subsystem, a beam scanning subsystem, a workpiece movement subsystem, an optical collection and detection subsystem, and a processing subsystem. The optical collection and detection system features, in the front quartersphere, a light channel assembly for collecting light reflected from the surface of the workpiece, and a front collector and wing collectors for collecting light scattered from the surface, to greatly improve the measurement capabilities of the system. The light channel assembly has a switchable edge exclusion mask and a reflected light detection system for improved detection of the reflected light.
    Type: Application
    Filed: October 28, 2014
    Publication date: February 12, 2015
    Applicant: KLA-Tencor Corporation
    Inventors: Richard E. Bills, Neil Judell, Klaus R. Freischlad, James P. McNiven
  • Publication number: 20150042993
    Abstract: A surface inspection system, as well as related components and methods, are provided. The surface inspection system includes a beam source subsystem, a beam scanning subsystem, a workpiece movement subsystem, an optical collection and detection subsystem, and a processing subsystem. The optical collection and detection system features, in the front quartersphere, a light channel assembly for collecting light reflected from the surface of the workpiece, and a front collector and wing collectors for collecting light scattered from the surface, to greatly improve the measurement capabilities of the system. The light channel assembly has a switchable edge exclusion mask and a reflected light detection system for improved detection of the reflected light.
    Type: Application
    Filed: October 28, 2014
    Publication date: February 12, 2015
    Applicant: KLA-TENCOR CORPORATION
    Inventors: Richard E. Bills, Neil Judell, Klaus R. Freischlad, James P. McNiven
  • Publication number: 20130342833
    Abstract: An optical collection and detection system for use in a surface inspection system for inspecting a surface of a workpiece. The surface inspection system has an incident beam projected through a back quartersphere and toward a desired location on the surface, which is a scanned spot having a known scanned spot size. The incident beam impinges on the surface to create scattered light that is collected by a collector module. The collector module includes collection optics for collecting and focusing the scattered light to form focused scattered light. A collector output slit is positioned at an output of the collector module, through which the collection optics focus the scattered light. The scattered light that is associated with the scanned spot forms an imaged spot at the collector output slit.
    Type: Application
    Filed: August 12, 2013
    Publication date: December 26, 2013
    Applicant: KLA-TENCOR CORPORATION
    Inventors: Neil Judell, Ian T. Kohl, Songping Gao, Richard E. Bills
  • Publication number: 20130335733
    Abstract: A method for inspecting a surface of a workpiece for asymmetric defects, by scanning an incident beam on the surface of the workpiece to impinge thereon to create reflected light extending along a light channel axis in a front quartersphere and scattered light, the incident beam and the light channel axis defining an incident plane, collecting the scattered light at a plurality of collectors disposed above the surface at defined locations such that scatter from asymmetric defects is collectable by at least one collector, detecting collector output and generating signals in response, and processing the signals associated with each collector individually to obtain information about asymmetric defects.
    Type: Application
    Filed: July 29, 2013
    Publication date: December 19, 2013
    Applicant: KLA-TENCOR CORPORATION
    Inventors: Richard E. Bills, Neil Judell, Timothy R. Tiemeyer, James P. McNiven
  • Patent number: 8601268
    Abstract: Described are a system and method for securing an online transaction. A request is output from an electronic device to a verification server to perform an online transaction. The verification server generates a challenge request. The challenge request is encrypted with a private key of a pair of cryptographic keys. The encrypted challenge request is decrypted with a public key of the pair of cryptographic keys. The decrypted challenge request and the challenge request generated by the verification server are compared. A verification result is generated in response to the comparison.
    Type: Grant
    Filed: March 17, 2011
    Date of Patent: December 3, 2013
    Assignee: ID Security, LLC
    Inventor: Neil Judell
  • Publication number: 20130310698
    Abstract: In one aspect, the invention relates to a computer-implemented method of triggering optical coherence tomography data collection. The method includes collecting optical coherence tomography data with respect to a vessel using an optical coherence tomography probe disposed in the vessel; determining a clearing radius and a quality value for each frame of optical coherence tomography data collected for the vessel using a computer; determining if a blood clearing state has occurred using at least one clearing radius and at least one quality value; and generating a trigger signal in response to the blood clearing state.
    Type: Application
    Filed: February 28, 2013
    Publication date: November 21, 2013
    Applicant: LightLab Imaging, Inc.
    Inventors: Neil Judell, Robert Steinbrecher, Joel Friedman, Christopher Petersen
  • Patent number: 8553215
    Abstract: An optical collection system for use in a surface inspection system for inspecting a surface of a workpiece. The surface inspection system has an incident beam projected through a back quartersphere and toward a location on the surface of the workpiece to impinge on the surface. This forms a reflected beam that extends along a light channel axis in a front quartersphere, and forms scattered light having a haze scatter portion. The incident beam and the light channel axis form an incident plane. The optical collection system includes back collectors that are positioned in the back quartersphere for collecting the scattered light, where each of the back collectors is disposed in the back quartersphere outside the incident plane, and at a relative minimum in the Rayleigh scatter.
    Type: Grant
    Filed: December 10, 2012
    Date of Patent: October 8, 2013
    Assignee: KLA-Tencor Corporation
    Inventors: Richard E. Bills, Neil Judell
  • Patent number: 8537350
    Abstract: A surface inspection system, as well as related components and methods, are provided. The surface inspection system includes a beam source subsystem, a beam scanning subsystem, a workpiece movement subsystem, an optical collection and detection subsystem, and a processing subsystem. The system features a variable polarization a polarizing relay assembly arranged to selectively permit the scattered light having a selected polarization orientation to pass along a detector optical axis to a light detection unit in the detection subsystem. The system also features a collector output width varying subsystem for varying the width of an output slit in response to changes in the location of the location scanned on the workpiece.
    Type: Grant
    Filed: September 23, 2011
    Date of Patent: September 17, 2013
    Assignee: KLA-Tencor Corporation
    Inventors: Neil Judell, Ian T. Kohl, Songping Gao, Richard E. Bills
  • Patent number: 8497984
    Abstract: A surface inspection system, as well as related components and methods, are provided. The surface inspection system includes a beam source subsystem, a beam scanning subsystem, a workpiece movement subsystem, an optical collection and detection subsystem, and a processing subsystem. Certain of these components, most notably the beam source subsystem, the beam scanning subsystem and the optical collection and detection subsystem are modular for ready field replacement and/or maintenance. The optical collection and detection system features wing collectors in the front quartersphere and back collectors in the back quartersphere for collected light scattered from the surface of the workpiece. This can greatly improve the measurement capabilities of the system. Also included is a method for detecting asymmetric defects using the wing collectors and back collectors.
    Type: Grant
    Filed: December 17, 2005
    Date of Patent: July 30, 2013
    Assignee: KLA-Tencor Corporation
    Inventors: Richard Earl Bills, Neil Judell, Timothy R. Tiemeyer, James Peter McNiven
  • Patent number: 8412312
    Abstract: In one aspect, the invention relates to a computer-implemented method of triggering optical coherence tomography data collection. The method includes collecting optical coherence tomography data with respect to a vessel using an optical coherence tomography probe disposed in the vessel; determining a clearing radius and a quality value for each frame of optical coherence tomography data collected for the vessel using a computer; determining if a blood clearing state has occurred using at least one clearing radius and at least one quality value; and generating a trigger signal in response to the blood clearing state.
    Type: Grant
    Filed: September 22, 2010
    Date of Patent: April 2, 2013
    Assignee: Lightlab Imaging, Inc.
    Inventors: Neil Judell, Robert Steinbrecher, Joel Friedman, Christopher L. Petersen
  • Patent number: 8330947
    Abstract: A surface inspection system includes a beam source subsystem, a beam scanning subsystem, a workpiece movement subsystem, an optical collection and detection subsystem, and a processing subsystem. The optical collection and detection system features back collectors disposed in the back quartersphere, outside the incident plane, for collecting light scattered from the surface of the workpiece. The back collectors are disposed at a relative minimum in the portion of scattered light attributable to haze relative to the portion of scattered light attributable to defect scatter portion, or, alternatively, at a relative minimum in the Rayleigh scatter.
    Type: Grant
    Filed: September 30, 2009
    Date of Patent: December 11, 2012
    Assignee: KLA-Tencor Corporation
    Inventors: Richard Earl Bills, Neil Judell, Klaus Reinhard Freischlad, James Peter McNiven
  • Publication number: 20120239928
    Abstract: Described are a system and method for securing an online transaction. A request is output from an electronic device to a verification server to perform an online transaction. The verification server generates a challenge request. The challenge request is encrypted with a private key of a pair of cryptographic keys. The encrypted challenge request is decrypted with a public key of the pair of cryptographic keys. The decrypted challenge request and the challenge request generated by the verification server are compared. A verification result is generated in response to the comparison.
    Type: Application
    Filed: March 17, 2011
    Publication date: September 20, 2012
    Inventor: Neil Judell
  • Publication number: 20120140071
    Abstract: Motion control circuitry for a vehicle-borne, gimbal-mounted sensor (such as a camera on a helicopter) includes main position control circuitry generating a commanded drive signal representing a desired driving of a positioning element (e.g. azimuth or elevation motor) to achieve a position of the sensor, and feed-forward vibration cancellation circuitry generating a cancellation drive signal representing a driving of the positioning element to cancel vehicle vibration. The feed-forward vibration cancellation circuitry includes a vibration sensor and adaptive feed-forward control circuitry, the vibration sensor generating a vibration signal representative of the vehicle vibration, and the adaptive feed-forward control circuitry applying a feed-forward gain to the vibration signal to generate the cancellation drive signal.
    Type: Application
    Filed: December 6, 2010
    Publication date: June 7, 2012
    Applicant: OPTICAL ALCHEMY, INC.
    Inventor: Neil Judell
  • Publication number: 20120013898
    Abstract: A surface inspection system, as well as related components and methods, are provided. The surface inspection system includes a beam source subsystem, a beam scanning subsystem, a workpiece movement subsystem, an optical collection and detection subsystem, and a processing subsystem. The system features a variable polarization a polarizing relay assembly arranged to selectively permit the scattered light having a selected polarization orientation to pass along a detector optical axis to a light detection unit in the detection subsystem. The system also features a collector output width varying subsystem for varying the width of an output slit in response to changes in the location of the location scanned on the workpiece.
    Type: Application
    Filed: September 23, 2011
    Publication date: January 19, 2012
    Applicant: KLA-TENCOR CORPORATION
    Inventors: Neil Judell, Ian Thomas Kohl, Songping Gao, Richard Earl Bills
  • Patent number: 8059268
    Abstract: A surface inspection system, as well as related components and methods, are provided. The surface inspection system includes a beam source subsystem, a beam scanning subsystem, a workpiece movement subsystem, an optical collection and detection subsystem, and a processing subsystem. The system features a variable polarization a polarizing relay assembly arranged to selectively permit the scattered light having a selected polarization orientation to pass along a detector optical axis to a light detection unit in the detection subsystem. They system also features a collector output width varying subsystem for varying the width of an output slit in response to changes in the location of the location scanned on the workpiece.
    Type: Grant
    Filed: October 22, 2009
    Date of Patent: November 15, 2011
    Assignee: KLA-Tencor Corporation
    Inventors: Neil Judell, Ian T. Kohl, Songping Gao, Richard E. Bills
  • Publication number: 20110071405
    Abstract: In one aspect, the invention relates to a computer-implemented method of triggering optical coherence tomography data collection. The method includes collecting optical coherence tomography data with respect to a vessel using an optical coherence tomography probe disposed in the vessel; determining a clearing radius and a quality value for each frame of optical coherence tomography data collected for the vessel using a computer; determining if a blood clearing state has occurred using at least one clearing radius and at least one quality value; and generating a trigger signal in response to the blood clearing state.
    Type: Application
    Filed: September 22, 2010
    Publication date: March 24, 2011
    Applicant: LIGHTLAB IMAGING, INC.
    Inventors: Neil Judell, Robert Steinbrecher, Joel Friedman, Christopher L. Petersen
  • Publication number: 20100265518
    Abstract: A surface inspection system includes a beam source subsystem, a beam scanning subsystem, a workpiece movement subsystem, an optical collection and detection subsystem, and a processing subsystem. The optical collection and detection system features back collectors disposed in the back quartersphere, outside the incident plane, for collecting light scattered from the surface of the workpiece. The back collectors are disposed at a relative minimum in the portion of scattered light attributable to haze relative to the portion of scattered light attributable to defect scatter portion, or, alternatively, at a relative minimum in the Rayleigh scatter.
    Type: Application
    Filed: September 30, 2009
    Publication date: October 21, 2010
    Applicant: KLA-Tencor Corporation
    Inventors: Richard Earl Bills, Neil Judell, Klaus Reinhard Rreischlad, James Peter McNiven