Abstract: A method of performing scatter correction on an X-ray image is disclosed. The method comprises obtaining an input image for processing based on a source X-ray image of a sample acquired using an X-ray detector, and determining a model of the sample based on the input image. The model is then evaluated by computing, based on the model, simulated X-ray image data and evaluating the simulated image data against the input image to determine whether a convergence criterion is fulfilled. An updated model of the sample is generated if the convergence criterion is not fulfilled. The model evaluating step is repeated based on one or more successive updated models until the convergence criterion is fulfilled in a final iteration, and scatter correction is then performed on the source X-ray image using simulated image data computed during the final iteration.

Abstract: An x-ray imaging method comprises the steps of: providing a set of at least one training material, the set comprising different materials and/or different thicknesses of the or each material; obtaining observed x-ray images of the at least one training material with a pixellated detector; building a database in a simulator of simulated scatter kernels for variable parameters within the simulator for each of the at least one training material; generating a transfer function between parameters of the simulator and parameters of the observed image which is independent of sample type and thickness; generating a whole image scatter estimate; predicting the direct radiation for each scatter kernel; applying the transfer function to the scatter estimate and the direct radiation or the inverse of the transfer function to the observed intensity values; performing the calculation Z?S?D<threshold to provide scatter free data and/or a scatter free image.

Abstract: An x-ray imaging method comprises the steps of: providing a set of at least one training material, the set comprising different materials and/or different thicknesses of the or each material; obtaining observed x-ray images of the at least one training material with a pixelated detector; building a database in a simulator of simulated scatter kernels for variable parameters within the simulator for each of the at least one training material; generating a transfer function between parameters of the simulator and parameters of the observed image which is independent of sample type and thickness; generating a whole image scatter estimate; predicting the direct radiation for each scatter kernel; applying the transfer function to the scatter estimate and the direct radiation or the inverse of the transfer function to the observed intensity values; performing the calculation Z?S?D<threshold to provide scatter free data and/or a scatter free image.

Abstract: An x-ray apparatus comprises an x-ray source and an x-ray detector and there between a member that is configured to perturb x-ray photons incident thereon. The apparatus further comprises a first database of values representative of material type and material thicknesses, a second database of scatter radiation values indicative of material type and/or material thicknesses, a processor configured to perform an algorithm which compares the output signal of the x-ray detector with values in the first database and to output a most likely material and/or thickness from the first database; selects from the second database the scatter radiation associated with the material type and/or material thickness; and removes the scatter radiation from an output signal of the x-ray detector.

Abstract: An x-ray apparatus comprises an x-ray source and an x-ray detector and there between a member that is configured to perturb x-ray photons incident thereon. The apparatus further comprises a first database of values representative of material type and material thicknesses, a second database of scatter radiation values indicative of material type and/or material thicknesses, a processor configured to perform an algorithm which compares the output signal of the x-ray detector with values in the first database and to output a most likely material and/or thickness from the first database; selects from the second database the scatter radiation associated with the material type and/or material thickness; and removes the scatter radiation from an output signal of the x-ray detector.

Abstract: A method of developing a product idea through establishment of a corporate entity is disclosed. The method comprises screening one or more new product ideas against a number of predetermined criteria to identify a filtered product idea which meets the predetermined criteria, establishing a portfolio corporate entity having share capital, assigning intellectual property rights in the filtered product idea to the portfolio corporate entity, and controlling the portfolio corporate entity while the filtered product idea is subject to product development.

Abstract: An X-ray generator comprises an evacuated and sealed X-ray tube, containing an electron gun and an X-ray target. An electron beam is produced by the electron gun in which the cathode is at negative high voltage, the electron gun consisting of a filament just inside the aperture of a Wehnelt grid which is biased negatively with respect to the filament. Two sets of beam deflection coils, are employed in two planes, mounted between the anode of the electron gun and the focussing lens to center the beam. Between the focussing lens and the target is an air-cored quadripole magnet which acts as a stigmator in that it turns the circular cross-section of the beam into an elongated one. This quadripole can be rotated about the tube axis so as to adjust the orientation of the line focus. The beam can be moved about on the target surface by controlling the currents in the four coils of the quadripole.

Abstract: This invention relates to a portable apparatus for carrying out X-ray fluorescence spectrometry on specimen materials at a distance from the apparatus. The apparatus comprises an X-ray generating tube, such as a microfocus tube, and two paraboloidal X-ray reflecting mirrors. The first collecting mirror is positioned in close coupled arrangement adjacent to the exit window of the tube, such that it emits parallel X-ray radiation to the second focusing mirror, which is aligned on the axis of and spaced apart from the first mirror (11). The second mirror (12) collects the parallel X-ray radiation at its end closest to the first mirror and emits X-ray radiation in a focused beam onto the specimen. The distance between the first and second mirrors is adjusted to suit the distance from the X-ray tube to the specimen. Focal spots on the specimen of diameter less than 15 microns (590.55 microinches) are possible, enabling precise analysis of small areas of the specimen.