Publication number: 20260309586
Abstract: An electronic device logistics, grading, clearing, and testing system is shown and described. The system includes an entry point for receiving devices and a routing table that directs each device to different stations based on its condition and processing needs. These stations include a pre-grading station to check for significant damage, a memory wipe station to clear data, a cleaning station to remove debris and labels, a labeling station to apply new identifiers, a grading station to assess the device's condition, and a functional testing station to check components like the screen, buttons, speakers, and cameras. After testing, the system prepares the device for exit by removing any connectors, then organizes it for shipment or further handling. The entire process is designed to minimize human contact and improve speed, accuracy, and efficiency.
Type:
Application
Filed:
November 28, 2025
Publication date:
October 8, 2026
Applicant:
Communications Test Design, Inc.
Inventors:
Brian PARSONS, Sean PARSONS, Mark PARSONS, George CANAVATI, Roy DEVATT, William KNOTT, Jaclyn DOMSOHN, Krithika MUTHUVEERAPPAN, Siddharth MAHESHWARI, Srinidhi RAMESH, Pratik SHRESTHA, Kshama DHADUTI, Nidhin DAVIS, Krutarth PATEL, Thomas Pulickal JOSEPH, Neil MORRISON, Daniel HARRER