Patents by Inventor Neil R. Van Lieu

Neil R. Van Lieu has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20100220315
    Abstract: A particle analyzer that includes optical waveguides, a support, and a detector. The optical waveguides direct spatially separated beams from a source of radiation to produce measuring beams in a sample flow measuring area. The support maintains each of the optical waveguides in a fixed relative position with respect to each other and maintains the positioning of the measuring beams within the measuring area. The detector senses light produced from the measuring beams interacting with a particle flowing through the measuring area. At least one of the support and the detector can be coupled to the core stream sample system. The coupling can use an optical waveguide device configured to convey optical radiation arising from sample interaction to the detector.
    Type: Application
    Filed: February 22, 2010
    Publication date: September 2, 2010
    Inventors: Michael M. Morrell, Neil R. Van Lieu