Abstract: A method and a system for automatically performing gauge repeatability and reproducibility (GRR) tests is provided. A handler is used to automatically move semiconductor devices from a device tray or other storage device into position for testing. When operating in a GRR mode, the handler is configured to place each of the semiconductor devices being tested in each possible testing position. A series of tests is performed on each of the semiconductor devices being tested in each of the possible testing positions. Furthermore, the series of tests may be repeated multiple times for each of the semiconductor devices in each position. In this embodiment, it is preferred that the semiconductor devices be reseated after each completing each series of tests. The semiconductor devices may be individual dies, systems on chips, multi-chip modules, or wafers.