Abstract: A sensor apparatus is provided. Multiple opposite and self-powered sensors are provided in another aspect of the present apparatus. A further aspect employs a sensor apparatus including a first pair of flexible piezoelectric sensors attached to opposite sides of an exterior surface of a workpiece and at least a second pair of flexible piezoelectric sensors attached to opposite sides of the exterior surface of the workpiece. Another aspect of the present apparatus uses pairs of thin film piezoelectric sensors which are configured to detect bending curvature of a workpiece in at least two dimensions by sending voltage output signals from both of the sensors of a first pair and/or both of the sensors of at least a second pair to a controller and/or electrical circuit.

Abstract: A voltage-controlled resistor is provided. The resistor structure includes first and second resistive elements each including a phase change material that changes resistance in response to a change in temperature of the phase change material. A heating element is arranged in thermal contact with the first and second resistive elements. A control circuit receives a selected input voltage and supplies power based on the selected input voltage to the heating element to heat the first and second resistive elements to a selected temperature. The first and second resistive elements, which are proximate to and electrically isolated from each other, have a selected resistance at the selected temperature. A feedback circuit senses a change in temperature of the first resistive element and adjusts power supplied to the heating element based on the change in temperature of the first resistive element to maintain a resistance of the second resistive element at the selected resistance.

Abstract: An optical attenuator (104) includes a substrate (116), an attenuation layer (120), and a pair of electrodes (124). The substrate (116) is transparent with respect to a range of light wavelengths. The attenuation layer (120) is formed on the substrate (116) and includes a strongly-correlated material. An optical transmissivity of the strongly-correlated material is strongly correlated with a resistance of the strongly-correlated material, and the optical transmissivity as applied to the light wavelengths is variable. The pair of electrodes (124) is at least one of formed on and embedded within the attenuation layer (120). The pair of electrodes (124) is configured to provide an indication of the resistance of the attenuation layer (120).

Abstract: An optical attenuator (104) includes a substrate (116), an attenuation layer (120), and a pair of electrodes (124). The substrate (116) is transparent with respect to a range of light wavelengths. The attenuation layer (120) is formed on the substrate (116) and includes a strongly-correlated material. An optical transmissivity of the strongly-correlated material is strongly correlated with a resistance of the strongly-correlated material, and the optical transmissivity as applied to the light wavelengths is variable. The pair of electrodes (124) is at least one of formed on and embedded within the attenuation layer (120). The pair of electrodes (124) is configured to provide an indication of the resistance of the attenuation layer (120).

Abstract: A voltage-controlled resistor is provided. The resistor structure includes first and second resistive elements each including a phase change material that changes resistance in response to a change in temperature of the phase change material. A heating element is arranged in thermal contact with the first and second resistive elements. A control circuit receives a selected input voltage and supplies power based on the selected input voltage to the heating element to heat the first and second resistive elements to a selected temperature. The first and second resistive elements, which are proximate to and electrically isolated from each other, have a selected resistance at the selected temperature. A feedback circuit senses a change in temperature of the first resistive element and adjusts power supplied to the heating element based on the change in temperature of the first resistive element to maintain a resistance of the second resistive element at the selected resistance.

Abstract: The invention utilizes the changes in physical properties of materials during a solid-solid phase transition in order to enhance the sensitivity of cantilever IR detectors. The substantial changes in properties during insulator-to-metal transitions (IMTs) of some materials are useful for controlling purposes according to the invention. A cantilever arrangement is provided with a cantilever being coated with an insulator-to-metal transitions (IMTs) material. Bending of the cantilever is achieved when the temperature of the (IMTs) material is within its phase transition temperature range. A Focal Plane Array (FPA) for detecting Infrared (IR) radiation including the cantilever arrangement of the invention is also proposed.