Patents by Inventor Nelson W Lytle

Nelson W Lytle has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8330122
    Abstract: Systems for preparation of a mark and authentication of a mark vis-a-vis a counterfeit mark. Emission spectra comprising intensity versus wavelength distributions are collected from a series of taggants. One or more taggants is selected from the collected emission data such that the spectra of the selected taggants are distinguishable. The selection is also based on a consideration of the emitted radiation of a substrate and a dispersive medium. The authentication system uses multivariate statistical analysis to calculate at least one measurement statistic of a mark to be authenticated and at least one statistical limit based on a series of training marks prepared by the preparation system. Authenticity of the mark is determined based on a comparison of the measurement statistic and the statistical limit.
    Type: Grant
    Filed: November 30, 2007
    Date of Patent: December 11, 2012
    Assignee: Honeywell International Inc
    Inventors: Karl J Smith, Paul G Vahey, Howard A Fraenkel, Robert G Bray, Nelson W Lytle, William R Rapoport, Gerald A Smith
  • Publication number: 20090141961
    Abstract: Systems for preparation of a mark and authentication of a mark vis-a-vis a counterfeit mark. Emission spectra comprising intensity versus wavelength distributions are collected from a series of taggants. One or more taggants is selected from the collected emission data such that the spectra of the selected taggants are distinguishable. The selection is also based on a consideration of the emitted radiation of a substrate and a dispersive medium. The authentication system uses multivariate statistical analysis to calculate at least one measurement statistic of a mark to be authenticated and at least one statistical limit based on a series of training marks prepared by the preparation system. Authenticity of the mark is determined based on a comparison of the measurement statistic and the statistical limit.
    Type: Application
    Filed: November 30, 2007
    Publication date: June 4, 2009
    Inventors: Karl J. Smith, Paul G. Vahey, Howard A. Fraenkel, Robert G. Bray, Nelson W. Lytle, William R. Rapoport