Abstract: According to various embodiments, a direct magnetic gradiometer having intrinsic subtraction of rotation signals from two oppositely polarized atomic ensembles within a single multi-pass cell is disclosed. The gradiometer includes three convex spherical mirrors aligned in a V-shape geometry. The three convex spherical mirrors include a front mirror and two back mirrors. The gradiometer further includes a probe laser beam. The laser beam is configured to be initially focused at a near-zero angle into a hole at a center of the front mirror such that the laser beam expands at the back mirrors and nearly overlaps with itself while undergoing multiple reflections between the front and back mirrors. The laser beam is further configured to be refocused to the front mirror at different spots in a number equal to half of total beam passes before exiting.

Abstract: According to various embodiments, a direct magnetic gradiometer having intrinsic subtraction of rotation signals from two oppositely polarized atomic ensembles within a single multi-pass cell is disclosed. The gradiometer includes three convex spherical mirrors aligned in a V-shape geometry. The three convex spherical mirrors include a front mirror and two back mirrors. The gradiometer further includes a probe laser beam. The laser beam is configured to be initially focused at a near-zero angle into a hole at a center of the front mirror such that the laser beam expands at the back mirrors and nearly overlaps with itself while undergoing multiple reflections between the front and back mirrors. The laser beam is further configured to be refocused to the front mirror at different spots in a number equal to half of total beam passes before exiting.

Abstract: A magnetometer for use with a sample including an atomic vapor includes a cell containing the sample such as a multipass cell including a first mirror element and a second mirror element configured so that an incoming light beam injected into the container will reflect multiple times between the first mirror element and the second mirror element. A polarized pump light source is configured to transmit pump light through the cell and pump the sample. A polarized probe light source configured to transmit probe light through the cell and probe the sample. A detector configured to detect a polarization angle or intensity of the probe light transmitted through the sample. A processor may be configured to calculate a precession frequency of the sample based on a first probe light pulse and a frequency correction based on a second probe light pulse.

Abstract: The disclosure provides an optical apparatus including at least one optical element including glass, at least one support including silicon and a housing including glass. Furthermore, the at least one optical element and the at least one support can be anodically bonded together, and the at least one support and the housing can be anodically bonded together. The disclosure further provides a method for fabricating optical components with durable bonds and incorporates active alignment.

Abstract: The disclosure provides an optical apparatus including at least one optical element including glass, at least one support including silicon and a housing including glass. Furthermore, the at least one optical element and the at least one support can be anodically bonded together, and the at least one support and the housing can be anodically bonded together. The disclosure further provides a method for fabricating optical components with durable bonds and incorporates active alignment.

Abstract: A magnetometer for use with a sample including an atomic vapor is disclosed. The magnetometer includes a cell containing the sample such as a multipass cell including a first mirror element and a second mirror element configured so that an incoming light beam injected into the container will reflect multiple times between the first mirror element and the second mirror element. A polarized pump light source is configured to transmit pump light through the cell and pump the sample. A polarized probe light source configured to transmit probe light through the cell and probe the sample. A detector configured to detect a polarization angle or intensity of the probe light transmitted through the sample. A processor may be configured to calculate a precession frequency of the sample based on a first probe light pulse and a frequency correction based on a second probe light pulse.