Patents by Inventor Nghi Phan
Nghi Phan has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 10306218Abstract: An exemplary camera calibration apparatus includes a movable, e.g., rotatable, support structure which is controllably positioned to allow for image capture of different test patterns and image capture of the same pattern at different distances by a mounted camera. A first test pattern is mounted on a wall, e.g., a pyramid shaped 4 sided wall formed by panels surrounding the camera under calibration. The movable support structure has a first mirror attached to a first side and has a second test pattern attached to a second side. A second mirror mounted on an internal sidewall of the calibration apparatus housing facilities a different image path distance between the camera capturing the image of the first test pattern and the first test pattern. The exemplary camera calibration apparatus is well suited for efficiently calibrating camera devices including a plurality of camera modules, e.g., optical chains, in a relatively small area.Type: GrantFiled: June 24, 2016Date of Patent: May 28, 2019Assignee: LIGHT LABS INC.Inventors: Nitesh Shroff, Weiguang Si, Nagilla Dikpal Reddy, John Sasinowski, Nghi Phan, Jiamin Bai, Harpuneet Singh, Rajiv Laroia
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Publication number: 20170280135Abstract: An exemplary camera calibration apparatus includes a movable, e.g., rotatable, support structure which is controllably positioned to allow for image capture of different test patterns and image capture of the same pattern at different distances by a mounted camera. A first test pattern is mounted on a wall, e.g., a pyramid shaped 4 sided wall formed by panels surrounding the camera under calibration. The movable support structure has a first mirror attached to a first side and has a second test pattern attached to a second side. A second mirror mounted on an internal sidewall of the calibration apparatus housing facilities a different image path distance between the camera capturing the image of the first test pattern and the first test pattern. The exemplary camera calibration apparatus is well suited for efficiently calibrating camera devices including a plurality of camera modules, e.g., optical chains, in a relatively small area.Type: ApplicationFiled: June 24, 2016Publication date: September 28, 2017Inventors: Nitesh Shroff, Weiguang Si, Nagilla Dikpal Reddy, John Sasinowski, Nghi Phan, Jiamin Bai, Harpuneet Singh, Rajiv Laroia
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Patent number: 8791033Abstract: A process for coating a semiconductor wafer with a coating composition comprises curing the coating with a pulsed UV light, thereby preventing delamination during reflow operations. In a particular embodiment, the coating composition comprises both epoxy and acrylate resins. The epoxy resin can be cured thermally; the acrylate resin is cured by UV irradiation.Type: GrantFiled: December 7, 2012Date of Patent: July 29, 2014Assignee: Henkel IP & Holding GmbHInventors: Jeffrey Gasa, Dung Nghi Phan, Jeffrey Leon, Sharad Hajela, Shengqian Kong
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Patent number: 8474060Abstract: A scanner for a scanning probe microscope (SPM) including a head has a scanner body that houses an actuator, and a sensor that detects scanner movement. The scanner body is removable from the head by hand and without the use of tools and has a total volume of less than about five (5) square inches. Provisions are made for insuring that movement of a probe device coupled to the scanner is restricted to be substantially only in the intended direction. A fundamental resonance frequency for the scanner can be greater than 10 kHz.Type: GrantFiled: April 29, 2011Date of Patent: June 25, 2013Assignee: Bruker Nano, Inc.Inventors: Nghi Phan, Jeff Markakis, Johannes Kindt, Carl Masser
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Patent number: 8443459Abstract: A high-bandwidth SPM tip scanner includes an objective that is vertically movable within the scan head to increase the depth of focus for the sensing light beam. Movable optics also are preferably provided to permit targeting of the sensing light beam on the SPM's probe and to permit the sensing light beam to track the probe during scanning. The targeting and tracking permit the impingement of a small sensing light beam spot on the probe under direct visual inspection of focused illumination beam of an optical microscope integrated into the SPM and, as a result, permits the use of a relatively small cantilever with a commensurately small resonant frequency. Images can be scanned on large samples having a largest dimension exceeding 7 mm with a resolution of less than 1 Angstrom and while scanning at rates exceeding 30 Hz.Type: GrantFiled: March 30, 2012Date of Patent: May 14, 2013Assignee: Bruker Nano, Inc.Inventors: Nghi Phan, Craig Cusworth, Craig Prater
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Publication number: 20120278957Abstract: A scanner for a scanning probe microscope (SPM) including a head has a scanner body that houses an actuator, and a sensor that detects scanner movement. The scanner body is removable from the head by hand and without the use of tools and has a total volume of less than about five (5) square inches. Provisions are made for insuring that movement of a probe device coupled to the scanner is restricted to be substantially only in the intended direction. A fundamental resonance frequency for the scanner can be greater than 10 kHz.Type: ApplicationFiled: April 29, 2011Publication date: November 1, 2012Inventors: Nghi Phan, Jeff Markakis, Johannes Kindt, Carl Masser
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Publication number: 20120204295Abstract: A high-bandwidth SPM tip scanner includes an objective that is vertically movable within the scan head to increase the depth of focus for the sensing light beam. Movable optics also are preferably provided to permit targeting of the sensing light beam on the SPM's probe and to permit the sensing light beam to track the probe during scanning. The targeting and tracking permit the impingement of a small sensing light beam spot on the probe under direct visual inspection of focused illumination beam of an optical microscope integrated into the SPM and, as a result, permits the use of a relatively small cantilever with a commensurately small resonant frequency. Images can be scanned on large samples having a largest dimension exceeding 7 mm with a resolution of less than 1 Angstrom and while scanning at rates exceeding 30 Hz.Type: ApplicationFiled: March 30, 2012Publication date: August 9, 2012Applicant: Bruker Nano, Inc.Inventors: Nghi Phan, Craig Cusworth, Craig Prater
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Patent number: 8161805Abstract: A method includes determining the point at which a tip of a probe based instrument contacts a sample and/or the area of that contact by dynamically oscillating a cantilever of the instrument in flexural and/or torsional modes. The method additionally includes using oscillation characteristics, such as amplitude, phase, and resonant frequency, to determine the status of the contact and to provide quantitative data. Static and quasi-static measurements, including contact stiffness and elastic modulus, can be obtained from the thus obtained data. Quasistatic measurements, such as creep and viscoelastic modulus, can be obtained by repeating the static measurements for a number of force profiles at different force application rates and correlating the resultant data using known theories.Type: GrantFiled: March 4, 2009Date of Patent: April 24, 2012Assignee: Bruker Nano, Inc.Inventors: Chanmin Su, Nghi Phan, Craig Prater
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Patent number: 8166567Abstract: A high-bandwidth SPM tip scanner is provided that additionally includes an objective that is vertically movable within the scan head to increase the depth of focus for the sensing light beam. Movable optics also are preferably provided to permit targeting of the sensing light beam on the SPM's probe and to permit the sensing light beam to track the probe during scanning. The targeting and tracking permit the impingement of a small sensing light beam spot on the probe under direct visual inspection of focused illumination beam of an optical microscope integrated into the SPM and, as a result, permits the use of a relatively small cantilever with a commensurately small resonant frequency. A high-bandwidth tip scanner constructed in this fashion has a fundamental resonant frequency greater than greater than 500 Hz and a sensing light beam spot minor diameter of less than 10 ?m.Type: GrantFiled: March 16, 2007Date of Patent: April 24, 2012Assignee: Bruker Nano, Inc.Inventors: Nghi Phan, Craig Cusworth, Craig Prater
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Patent number: 7770231Abstract: A method and apparatus are provided that have the capability of rapidly scanning a large sample of arbitrary characteristics under force control feedback so has to obtain a high resolution image. The method includes generating relative scanning movement between a probe of the SPM and a sample to scan the probe through a scan range of at least 4 microns at a rate of at least 30 lines/sec and controlling probe-sample interaction with a force control slew rate of at least 1 mm/sec. A preferred SPM capable of achieving these results has a force controller having a force control bandwidth of at least closed loop bandwidth of at least 10 kHz.Type: GrantFiled: August 2, 2007Date of Patent: August 3, 2010Assignee: Veeco Instruments, Inc.Inventors: Craig Prater, Chanmin Su, Nghi Phan, Jeffrey M. Markakis, Craig Cusworth, Jian Shi, Johannes H. Kindt, Steven F. Nagle, Wenjun Fan
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Patent number: 7596990Abstract: A cantilever probe-based instrument is controlled to counteract the lateral loads imposed on the probe as a result of probe sample interaction. The probe preferably includes an active cantilever, such as a so-called bimorph cantilever. Force counteraction is preferably achieved by monitoring a lateral force-dependent property of probe operation such as cantilever free end deflection angle and applying a voltage to at least one of the cantilever and one or more separate actuators under feedback to maintain that property constant as the probe-sample spacing decreases. The probe could further uses at least one of contact flexural and torsional resonances characteristics to determine contact and release points. With the knowledge of the tip profile, quantitative mechanical data for probe sample interaction can be obtained.Type: GrantFiled: April 14, 2005Date of Patent: October 6, 2009Assignee: Veeco Instruments, Inc.Inventors: Chanmin Su, Nghi Phan, Craig Prater
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Publication number: 20090222958Abstract: A method includes determining the point at which a tip of a probe based instrument contacts a sample and/or the area of that contact by dynamically oscillating a cantilever of the instrument in flexural and/or torsional modes. The method additionally includes using oscillation characteristics, such as amplitude, phase, and resonant frequency, to determine the status of the contact and to provide quantitative data. Static and quasi-static measurements, including contact stiffness and elastic modulus, can be obtained from the thus obtained data. Quasistatic measurements, such as creep and viscoelastic modulus, can be obtained by repeating the static measurements for a number of force profiles at different force application rates and correlating the resultant data using known theories.Type: ApplicationFiled: March 4, 2009Publication date: September 3, 2009Inventors: Chanmin Su, Nghi Phan, Craig Prater
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Publication number: 20090032706Abstract: A method and apparatus are provided that have the capability of rapidly scanning a large sample of arbitrary characteristics under force control feedback so has to obtain a high resolution image. The method includes generating relative scanning movement between a probe of the SPM and a sample to scan the probe through a scan range of at least 4 microns at a rate of at least 30 lines/sec and controlling probe-sample interaction with a force control slew rate of at least 1 mm/sec. A preferred SPM capable of achieving these results has a force controller having a force control bandwidth of at least closed loop bandwidth of at least 10 kHz.Type: ApplicationFiled: August 2, 2007Publication date: February 5, 2009Inventors: Craig Prater, Chanmin Su, Nghi Phan, Jeffrey M. Markakis, Craig Cusworth, Jian Shi, Johannes H. Kindt, Steven F. Nagle, Wenjun Fan
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Publication number: 20080223119Abstract: A high-bandwidth SPM tip scanner is provided that additionally includes an objective that is vertically movable within the scan head to increase the depth of focus for the sensing light beam. Movable optics also are preferably provided to permit targeting of the sensing light beam on the SPM's probe and to permit the sensing light beam to track the probe during scanning. The targeting and tracking permit the impingement of a small sensing light beam spot on the probe under direct visual inspection of focused illumination beam of an optical microscope integrated into the SPM and, as a result, permits the use of a relatively small cantilever with a commensurately small resonant frequency. A high-bandwidth tip scanner constructed in this fashion has a fundamental resonant frequency greater than greater than 500 Hz and a sensing light beam spot minor diameter of less than 10 ?m.Type: ApplicationFiled: March 16, 2007Publication date: September 18, 2008Inventors: Nghi Phan, Craig Cusworth, Craig Prater
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Publication number: 20060000263Abstract: A cantilever probe-based instrument is controlled to counteract the lateral loads imposed on the probe as a result of probe sample interaction. The probe preferably includes an active cantilever, such as a so-called bimorph cantilever. Force counteraction is preferably achieved by monitoring a lateral force-dependent property of probe operation such as cantilever free end deflection angle and applying a voltage to at least one of the cantilever and one or more separate actuators under feedback to maintain that property constant as the probe-sample spacing decreases. The probe could further uses at least one of contact flexural and torsional resonances characteristics to determine contact and release points. With the knowledge of the tip profile, quantitative mechanical data for probe sample interaction can be obtained.Type: ApplicationFiled: April 14, 2005Publication date: January 5, 2006Inventors: Chanmin Su, Nghi Phan, Craig Prater
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Patent number: D857075Type: GrantFiled: October 24, 2017Date of Patent: August 20, 2019Assignee: EYEQUE INC.Inventors: Ying Xu, Nghi Phan, Yue Wang, John Serri