Abstract: Apparatus for measuring a pattern in a surface of an object, comprising a plurality of pixel or sensor elements being responsive to a physical parameter of the object surface, and means for establishing an overall, segmented picture related to said pattern, and also comprising at least one diode functionally associated with each sensor element for contributing to one or more of the following functions: selectively addressing said sensor element; activating said sensor element; and sensing of said physical parameter.

Abstract: Apparatus for measuring a pattern in a surface of an object, comprising a plurality of pixel or sensor elements being responsive to a physical parameter of the object surface, and means for establishing an overall, segmented picture related to said pattern, and also comprising at least one diode functionally associated with each sensor element for contributing to one or more of the following functions: selectively addressing said sensor element activating said sensor element, and sensing of said physical parameter.

Abstract: A method and apparatus is provided for measuring patterns in an at least partially heat conducting surface. The method includes the steps of bringing a plurality of surface sensor elements into thermal contact with a substantial part of a surface to be examined, heating the plurality of surface sensor elements with a supplied heat, measuring a temperature or a change in temperature of each surface sensor element one or more times, or continuously, comparing the measured temperature or the change in temperature in each surface sensor element to the supplied heat to provide a measure of a loss of heat from each surface sensor element to the surface to be examined, and collocating the loss of heat at each surface sensor element to provide a segmented picture of the surface to be examined based upon a variation in the loss of heat from the plurality of surface sensor elements.