Patents by Inventor Niall MCGURNAGHAN

Niall MCGURNAGHAN has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Self-test circuitry
    Patent number: 11536767
    Abstract: The present disclosure relates to self-test circuitry for a system that includes one or more current control subsystems, each current control subsystem having a load terminal for coupling the current control subsystem to a load. The self-test circuitry comprises: a signal path associated with each current control subsystem, each signal path configured to selectively couple a measurement node to the load terminal of the current control subsystem, wherein the measurement node is common to all of the signal paths; voltage detection circuitry; and test voltage source circuitry configured to provide a test voltage to the measurement node. The voltage detection circuitry is operable to output a signal indicative of a fault condition if a voltage detected at the measurement node differs from the test voltage when the measurement node is coupled to the load terminal.
    Type: Grant
    Filed: October 8, 2020
    Date of Patent: December 27, 2022
    Assignee: Cirrus Logic, Inc.
    Inventors: James Wells, Saurabh Singh, Huy Binh Le, Gavin Wilson, Niall McGurnaghan, Simon R. Foster, Mark McCloy-Stevens
  • SELF-TEST CIRCUITRY
    Publication number: 20210148968
    Abstract: The present disclosure relates to self-test circuitry for a system that includes one or more current control subsystems, each current control subsystem having a load terminal for coupling the current control subsystem to a load. The self-test circuitry comprises: a signal path associated with each current control subsystem, each signal path configured to selectively couple a measurement node to the load terminal of the current control subsystem, wherein the measurement node is common to all of the signal paths; voltage detection circuitry; and test voltage source circuitry configured to provide a test voltage to the measurement node. The voltage detection circuitry is operable to output a signal indicative of a fault condition if a voltage detected at the measurement node differs from the test voltage when the measurement node is coupled to the load terminal.
    Type: Application
    Filed: October 8, 2020
    Publication date: May 20, 2021
    Applicant: Cirrus Logic International Semiconductor Ltd.
    Inventors: James WELLS, Saurabh SINGH, Huy Binh LE, Gavin WILSON, Niall MCGURNAGHAN, Simon R. FOSTER, Mark MCCLOY-STEVENS