Patents by Inventor Niannian ZHENG

Niannian ZHENG has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20240028016
    Abstract: The invention provides real-time prediction and regulation methods and systems of product quality based on a process dynamic pattern. The prediction method includes: constructing a state space probability model of quality pattern dynamic motion equation; calculating a probability density function distribution of a quality pattern according to the probability model; performing optimized learning on parameters of the state space probability model of quality pattern dynamic motion equation according to the probability density function distribution, to obtain optimal model parameters and an optimized state space probability model of quality-pattern dynamic motion equation; and performing online prediction on product quality indicators based on the optimized state space probability model.
    Type: Application
    Filed: February 6, 2023
    Publication date: January 25, 2024
    Inventors: Xiaoli Luan, Niannian Zheng, Haiying Wan, Shunyi Zhao, Yuqing Ni, Fei Liu
  • Patent number: 11120350
    Abstract: The present invention discloses a multilevel pattern monitoring method for a process industry process and belongs to the fields of industrial production and processing. The multilevel pattern monitoring method comprises the steps: dividing an industry process into a plurality of levels from the view of patterns, selecting a different key performance index for each level, acquiring operating data relevant to the key performance index, identifying the pattern of each level, and proposing a pattern monitoring method for each level based on a data driven method to realize pattern monitoring in the industry process.
    Type: Grant
    Filed: January 24, 2019
    Date of Patent: September 14, 2021
    Assignee: JIANGNAN UNIVERSITY
    Inventors: Xiaoli Luan, Niannian Zheng, Enbo Feng, Chenglin Liu, Fei Liu
  • Publication number: 20190294987
    Abstract: The present invention discloses a multilevel pattern monitoring method for a process industry process and belongs to the fields of industrial production and processing. The multilevel pattern monitoring method comprises the steps: dividing an industry process into a plurality of levels from the view of patterns, selecting a different key performance index for each level, acquiring operating data relevant to the key performance index, identifying the pattern of each level, and proposing a pattern monitoring method for each level based on a data driven method to realize pattern monitoring in the industry process.
    Type: Application
    Filed: January 24, 2019
    Publication date: September 26, 2019
    Inventors: Xiaoli LUAN, Niannian ZHENG, Enbo FENG, Chenglin LIU, Fei LIU