Abstract: A method for assigning charge state in mass spectrometry includes receiving a detector response signal corresponding to a plurality of ion arrival events. The detector response signal includes information related to individual ion responses generated by a detector for each ion arrival event. Detector response profiles are generated for mass-to-charge (m/z) bins of a mass spectrum generated from the ion arrival events based on the detector response signal. The m/z bins are grouped into a plurality of groups based on a similarity of the detector response profiles of the m/z bins. A charge state is assigned to one or more features based on the groups of m/z bins.

Abstract: Devices and methods are described for assigning charge state to detected ions from a mass analysis instrument. In one of the methods, the charge state may be assigned, for instance, by evaluation a detector response signal including information related to individual ion responses generated by an ion detector for each ion arrival event captured by the detector. The detector response signal may then be evaluated in combination with one or more additional features corresponding to the ion arrival event to assign a charge state for that ion arrival event.

Abstract: Methods for correlating a product ion in a mass spectrum to a precursor ion are disclosed herein, comprising determining a precursor ion ml z corresponding to the product ion as an m/z at which the product ion appears in a maximum amount of the series of mass spectra. Methods also can comprise obtaining a series of mass spectra for a sample across a mass range, each of the series of mass spectra having a precursor ion transmission window defined by a width (W) that overlaps with that of at least two of the series of mass spectra by a step size (S).

Abstract: The technology relates to systems and methods for performing mass spectrometry analysis of a sample. An example method may include receiving, as input via an input device, a target mass-to-charge (m/z) ratio for a fragment ion of interest; setting a target m/z range based on the target m/z ratio; ionizing the sample to generate precursor ions; fragmenting the precursor ions to generate fragment ions having a range of mass-to-charge ratios larger than the target m/z range; accelerating the fragment ions to a detector such that fragment ions inside and outside of the target m/z ratio are detected; summing a count of fragment ions within the target m/z range without storing ion counts for fragment ions outside of the target m/z range; and storing the summed ion count as corresponding with the target mass-to-charge ratio.

Abstract: Devices and methods are described for assigning charge state to detected ions from a mass analysis instrument. In one of the methods, the charge state may be assigned, for instance, by evaluation a detector response signal including information related to individual ion responses generated by an ion detector for each ion arrival event captured by the detector. The detector response signal may then be evaluated in combination with one or more additional features corresponding to the ion arrival event to assign a charge state for that ion arrival event.

Abstract: A method for assigning charge state in mass spectrometry includes receiving a detector response signal corresponding to a plurality of ion arrival events. The detector response signal includes information related to individual ion responses generated by a detector for each ion arrival event. Detector response profiles are generated for mass-to-charge (m/z) bins of a mass spectrum generated from the ion arrival events based on the detector response signal. The m/z bins are grouped into a plurality of groups based on a similarity of the detector response profiles of the m/z bins. A charge state is assigned to one or more features based on the groups of m/z bins.

Abstract: Systems and methods are disclosed for dynamically switching an ion guide and a TOF mass analyzer between concentrating or not concentrating ions in a targeted acquisition. Product ions are ejected from the ion guide into the TOF mass analyzer and the intensity of a known product ion is measured at two or more time steps. The ion guide initially ejects product ions using a sequential or Zeno pulsing mode that concentrates product ions with different m/z values within the TOF mass analyzer at the same time. If the intensity of the product ion is increasing and greater than a threshold intensity, the ion guide switches to a continuous or normal pulsing mode that does not concentrate ions with different m/z values in the TOF mass analyzer at the same time. Similarly, if the intensity decreases below a threshold in continuous mode, the ion guide switches back to sequential mode.

Abstract: The present teachings are directed to methods and systems for the selection of ions for subsequent ion fragmentation in the analysis of a sample. Rather than select the most intense subset of precursor ions for further analysis in an attempt to maximize the number of high quality, identifiable MS/MS spectra, in some settings, systems and methods for analyzing and 5 identifying precursor ions for further processing can benefit from a discovery approach in which precursor ions are selected randomly/stochastically.

Abstract: The present teachings are directed to methods and systems for the selection of ions for subsequent ion fragmentation in the analysis of a sample. Rather than select the most intense subset of precursor ions for further analysis in an attempt to maximize the number of high quality, identifiable MS/MS spectra, in some settings, systems and methods for analyzing and 5 identifying precursor ions for further processing can benefit from a discovery approach in which precursor ions are selected randomly/stochastically.

Abstract: Systems and methods for analyzing compounds in a sample. In one embodiment, the present technology is directed towards a method of analyzing a sample, comprising: emitting ions from the sample; selectively filtering the emitted ions for at least one designated trigger ion; fragmenting the designated trigger ions; scanning for a designated trigger ion fragment; and upon detecting the designated trigger ion fragment, scanning for at least one confirmatory ion fragment.

Abstract: Systems and methods for analyzing compounds in a sample. In one embodiment, the present technology is directed towards a method of analyzing a sample, comprising: emitting ions from the sample; selectively filtering the emitted ions for at least one designated trigger ion; fragmenting the designated trigger ions; scanning for a designated trigger ion fragment; and upon detecting the designated trigger ion fragment, scanning for at least one confirmatory ion fragment.

Abstract: Systems and methods for analyzing compounds in a sample. In one embodiment, the present technology is directed towards a method of analyzing a sample, comprising: emitting ions from the sample; selectively filtering the emitted ions for at least one designated trigger ion; fragmenting the designated trigger ions; scanning for a designated trigger ion fragment; and upon detecting the designated trigger ion fragment, scanning for at least one confirmatory ion fragment.

Abstract: Systems and methods for analyzing compounds in a sample. In one embodiment, the present technology is directed towards a method of analyzing a sample, comprising: emitting ions from the sample; selectively filtering the emitted ions for at least one designated trigger ion; fragmenting the designated trigger ions; scanning for a designated trigger ion fragment; and upon detecting the designated trigger ion fragment, scanning for at least one confirmatory ion fragment.

Abstract: Systems and methods for analyzing compounds in a sample. In one embodiment, a mass spectrometer includes an ion source for emitting a plurality of ions from a sample together with a detector positioned downstream of said ion source and configured to detect the impact of emitted ions on the detector. The mass spectrometer also includes a controller operatively coupled to the detector and to the ion source and configured to calculate the m/z for each detected ion. The controller comprises a mass defect filter configured to determine if the m/z for each detected ion falls within a pre-determined mass defect range. The mass spectrometer also includes data storage coupled to the controller, wherein the data storage is configured to store detected ion m/z data corresponding to the m/z for a detected ion if the m/z falls within the mass defect range. The mass spectrometer may also include an ion mass filter positioned downstream of the ion source and operatively coupled to the controller.

Abstract: Systems, methods, and computer program products useful in controlling the fragmentation of ions. Control of fragmentation is achieved by varying the collision energy imparted to precursor ions.

Abstract: A first mass spectrum and a second mass spectrum of the same ion sample can be analyzed to determine reaction pairs. These reaction pairs are determined based on a selected neutral difference by shifting the second mass spectrum by the neutral difference relative to the first mass spectrum to provide a shifted mass spectrum. Then, the shifted mass spectrum is compared with the first mass spectrum of the ion sample to determine the reaction pairs based on the neutral difference.

Abstract: In the field of mass spectrometry, a method of obtaining a mass spectrum enriched with fragment ions while retaining the precursor ion. The technique includes varying the collision energy experienced by the precursor ion such that a range of fragmentations occur. Related methods are also disclosed for obtaining MS, MS2, MS3 and MSn spectra which are enriched with fragment ions.

Abstract: Systems and methods for calculating ion flux. In one embodiment, a mass spectrometer includes an ion source for emitting a beam of ions from a sample and at least one detector positioned downstream of said ion source. The at least one detector comprises a plurality of detector channels. The mass spectrometer also includes a controller operatively coupled to the plurality of detector channels. The controller is configured to: determine ion abundance data correlated to each detector channel; determine corrected ion abundance data correlated to each detector channel; determine confidence data corresponding to the ion abundance data for each of the detector channels; and determine a confidence weighted abundance estimate of the ion flux correlated to both the ion abundance data and to the confidence data.

Abstract: Systems and methods for analyzing compounds in a sample. In one embodiment, a mass spectrometer includes an ion source for emitting a plurality of ions from a sample together with a detector positioned downstream of said ion source and configured to detect the impact of emitted ions on the detector. The mass spectrometer also includes a controller operatively coupled to the detector and to the ion source and configured to calculate the m/z for each detected ion. The controller comprises a mass defect filter configured to determine if the m/z for each detected ion falls within a pre-determined mass defect range. The mass spectrometer also includes data storage coupled to the controller, wherein the data storage is configured to store detected ion m/z data corresponding to the m/z for a detected ion if the m/z falls within the mass defect range. The mass spectrometer may also include an ion mass filter positioned downstream of the ion source and operatively coupled to the controller.

Abstract: Systems, methods, and computer program products useful in controlling the fragmentation of ions. Control of fragmentation is achieved by varying the collision energy imparted to precursor ions.