Patents by Inventor Nicholas Buchan

Nicholas Buchan has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7396770
    Abstract: To smooth silicon sliders that have been parted from each other on a wafer by DRIE, an isotropic etch using fluorine either in a gas or in an aqueous solution is performed prior to separating the individual sliders from the wafer.
    Type: Grant
    Filed: January 10, 2006
    Date of Patent: July 8, 2008
    Assignee: Hitachi Global Storage Technologies Netherlands B.V.
    Inventors: Timothy Clark Reiley, Nicholas Buchan
  • Publication number: 20070158301
    Abstract: To smooth silicon sliders that have been parted from each other on a wafer by DRIE, an isotropic etch using fluorine either in a gas or in an aqueous solution is performed prior to separating the individual sliders from the wafer.
    Type: Application
    Filed: January 10, 2006
    Publication date: July 12, 2007
    Inventors: Timothy Reiley, Nicholas Buchan
  • Publication number: 20060044690
    Abstract: A method and apparatus for manufacturing silicon sliders with reduced susceptibility to fracture of the substrate from which they are manufactured is disclosed. A monocrystalline silicon wafer is formed having an orientation in the {100} crystallographic plane. The silicon wafer includes a notch for orienting the silicon wafer, wherein the notch is formed substantially in the <100> direction. Sliders are formed from the silicon wafer.
    Type: Application
    Filed: August 31, 2004
    Publication date: March 2, 2006
    Inventors: Nicholas Buchan, Timothy Reiley
  • Publication number: 20050219754
    Abstract: A resist transfer pad and method of use are described for forming a uniform photoresist on the surface of a workpiece such as a slider. The resist transfer pad includes a layer of cured polydimethylsiloxane (PDMS) on a cushioning layer, e.g. silicone rubber, and an optional stiffening layer. The sliders are preferably mounted on a carrier or pallet. In one preferred embodiment the loaded resist transfer pads are applied to the slider surface by roll lamination where the loaded resist transfer pad is transported by a roller system using a cover-tape and pressed against the slider surface. Subsequently the cover-tape and the resist transfer pad are lifted off and the photoresist remains on the transducer. An alternative embodiment uses a vacuum, piston laminator to press the loaded resist transfer pad onto the surface of the transducer.
    Type: Application
    Filed: March 30, 2004
    Publication date: October 6, 2005
    Inventors: Nicholas Buchan, Cherngye Hwang, Timothy Reiley, Li Zheng
  • Publication number: 20050068680
    Abstract: A slider assembly is provided comprising a plurality of sliders bonded by a debondable solid encapsulant. The solid encapsulant is comprised of a polymer prepared by polymerizing a mixture of first and second monomers in a nonstoichiometric ratio effective to render the encapsulant debondable. Each slider has a surface that is free from the encapsulant. The encapsulant-free surfaces are coplanar to each other. Also provided are methods for forming the assembly and methods for patterning a slider surface using the encapsulant.
    Type: Application
    Filed: September 25, 2003
    Publication date: March 31, 2005
    Inventors: Nicholas Buchan, Michael Chaw, Sean Clemenza, Dan Dawson, Craig Hawker, James Hedrick, Wesley Hillman, Teddie Magbitang, Willi Volksen, Dennis McKean, Robert Miller
  • Publication number: 20050070118
    Abstract: A method for fabricating recording head sliders made from silicon substrates, is described. A Silicon wafer with a SiO2 overcoat is provided, and a layer of material which is resistant to Deep Reactive Ion Etching (DRIE) is deposited on the SiO2 overcoat. A patterned layer of material which is resistant to Reactive Ion Etching (RIE) is deposited on the layer of DRIE-resistant material to form a primary mask. RIE is used through the primary mask to pattern the SiO2 overcoat layer and the layer of DRIE-resistant material. The primary mask is then removing to expose the layer of DRIE-resistant material which has now been patterned to form a secondary mask. DRIE is then used through the secondary mask to cut the Si wafer into pieces. Finally, the secondary mask is removed.
    Type: Application
    Filed: September 29, 2003
    Publication date: March 31, 2005
    Inventors: Nicholas Buchan, Timothy Reiley
  • Patent number: 6318177
    Abstract: A method for producing a micromechanical component (e.g., a capacitive acceleration sensor) having one or several electrical or mechanical function variables dependent on at least one geometric design parameter. The micromechanical component is produced by an etching process via which a structure with bars and trenches is formed. The structure is formed by drafting a design for the micromechanical component in such a way that the geometric design parameter within the local area of the micromechanical component is subject to a predetermined process-related regularity. The design parameter is essentially constant in relation to function blocks in particular, so that in the etching process, the process tolerance of the design parameter within the micromechanical component essentially shows no locus dependency.
    Type: Grant
    Filed: April 29, 1999
    Date of Patent: November 20, 2001
    Assignee: Robert Bosch GmbH
    Inventors: Nicholas Buchan, Michael Fehrenbach, Dietrich Schubert
  • Publication number: 20010017058
    Abstract: A method for producing a micromechanical component (e.g., a capacitive acceleration sensor) having one or several electrical or mechanical function variables dependent on at least one geometric design parameter. The micromechanical component is produced by an etching process via which a structure with bars and trenches is formed. The structure is formed by drafting a design for the micromechanical component in such a way that the geometric design parameter within the local area of the micromechanical component is subject to a predetermined process-related regularity. The design parameter is essentially constant in relation to function blocks in particular, so that in the etching process, the process tolerance of the design parameter within the micromechanical component essentially shows no locus dependency.
    Type: Application
    Filed: April 29, 1999
    Publication date: August 30, 2001
    Inventors: NICHOLAS BUCHAN, MICHAEL FEHRENBACH, DIETRICH SCHUBERT
  • Patent number: 6117701
    Abstract: A rate-of-rotation sensor includes a three-layer system. The rate-of-rotation sensor and the conductor traces are patterned out of the third layer. The conductor traces are electrically insulated (isolated) by cutouts from other regions of the third layer and by a second electrically insulating layer from a first layer. Thus, a simple electrical contacting (configuration) is achieved that is patterned out of a three-layer system. Since the same etching process is used for the first and the third layer, an especially efficient manufacturing is possible.
    Type: Grant
    Filed: August 8, 1997
    Date of Patent: September 12, 2000
    Assignee: Robert Bosch GmbH
    Inventors: Nicholas Buchan, Horst Muenzel, Franz Laermer, Michael Offenberg, Udo Bischof, Markus Lutz
  • Patent number: 5937275
    Abstract: A method for producing acceleration sensors is proposed, in which a silicon layer that is deposited in an epitaxial application system is used. Above sacrificial layers (2) applied to the substrate (1), the material grows in the form of a polysilicon layer (6), which has a certain surface roughness. By application of a photoresist and by a wet etching process, this surface roughness is eliminated. Alternatively, chemical-mechanical smoothing is contemplated.
    Type: Grant
    Filed: October 27, 1997
    Date of Patent: August 10, 1999
    Assignee: Robert Bosch GmbH
    Inventors: Horst Munzel, Michael Offenberg, Klaus Heyers, Bernhard Elsner, Markus Lutz, Helmut Skapa, Heinz-Georg Vossenberg, Nicholas Buchan, Eckhard Graf