Patents by Inventor Nicholas E. Paulin

Nicholas E. Paulin has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method and apparatus for integrated circuit failure analysis
    Patent number: 6819125
    Abstract: The present invention provides a method and apparatus for detecting and locating a fault in an integrated circuit structure formed in one or more insulating layers deployed on a semiconductor substrate. The apparatus includes a probe tool capable of detecting a fault in the integrated circuit structure, a laser tool capable of forming an electrical connection between the integrated circuit structure and the semiconductor substrate, and a controller coupled to the probe tool and the laser tool, wherein the controller is capable of directing the laser tool to form the electrical connection between the integrated circuit structure and the semiconductor substrate in response to detecting the fault in the integrated circuit structure.
    Type: Grant
    Filed: July 23, 2003
    Date of Patent: November 16, 2004
    Assignee: Micron Technology, Inc.
    Inventors: James E. Green, Nicholas E. Paulin, Justin R. Arrington, Michael D. Kenney