Abstract: The present disclosure describes systems and methods to correct for perspective calibration variations of a variable thickness specimen with a single camera extensometer in a video extensometer system. In some examples, the systems and methods compensate for a change between a reference characteristic, such as a calibration plane, and an actual physical characteristic, such as a testing plane associated with a surface of a test specimen, during a testing operation. In some examples, a correction value is applied to an output (e.g., measured dimensions of the imaged test specimen) to compensate for the difference between the reference characteristic and the physical characteristic.

Abstract: The present disclosure describes systems and methods to correct for perspective calibration variations of a variable thickness specimen with a single camera extensometer in a video extensometer system. In some examples, the systems and methods compensate for a change between a reference characteristic, such as a calibration plane, and an actual physical characteristic, such as a testing plane associated with a surface of a test specimen, during a testing operation. In some examples, a correction value is applied to an output (e.g., measured dimensions of the imaged test specimen) to compensate for the difference between the reference characteristic and the physical characteristic.

Abstract: The present disclosure describes systems and methods for conducting deformation (e.g., extension and/or strain) measurements based on characteristics of a test specimen using light sourced from a single side of a test specimen. The light source and an imaging device are arranged on a single side of the test specimen relative to a back screen while the light source illuminates both a front surface of the test specimen and the back screen. The back screen reflects light to create a silhouette of the test specimen. The imaging device captures images of one or more markers on a front surface of the test specimen, as well as measuring position of the markers during the testing process. The imaging device also measures relative changes in position of the edges of the test specimen during the testing process, by analyzing the edges of the silhouetted image created by the reflective back screen.

Abstract: The present disclosure describes systems and methods to correct for perspective calibration variations of a variable thickness specimen with a single camera extensometer in a video extensometer system. In some examples, the systems and methods compensate for a change between a reference characteristic, such as a calibration plane, and an actual physical characteristic, such as a testing plane associated with a surface of a test specimen, during a testing operation. In some examples, a correction value is applied to an output (e.g., measured dimensions of the imaged test specimen) to compensate for the difference between the reference characteristic and the physical characteristic.

Abstract: The present disclosure describes systems and methods for conducting deformation (e.g., extension and/or strain) measurements based on characteristics of a test specimen using light sourced from a single side of a test specimen. The light source and an imaging device are arranged on a single side of the test specimen relative to a back screen while the light source illuminates both a front surface of the test specimen and the back screen. The back screen reflects light to create a silhouette of the test specimen. The imaging device captures images of one or more markers on a front surface of the test specimen, as well as measuring position of the markers during the testing process. The imaging device also measures relative changes in position of the edges of the test specimen during the testing process, by analyzing the edges of the silhouetted image created by the reflective back screen.