Abstract: Methods for fabricating printed devices and monitoring one or more performance characteristics of the printed devices during their fabrication in a high-speed process. Such a method includes developing a physics-based model of at least a first component of the printed devices, fabricating the printed devices with the high-speed process using fabrication steps that comprise depositing the first components, acquiring a physical characteristic of a plurality of the first components of a plurality of the printed devices following the depositing of the first components, predicting a performance characteristic of the printed devices based on the physics-based model of the first component and the physical characteristic acquired of the plurality of the first components; and then modifying at least one of the fabrication steps performed during the fabricating of a subsequently-fabricated group of the printed devices to adjust the performance characteristic of the subsequently-fabricated group of the printed devices.