Abstract: A system for stressing and monitoring an electrical device, such that the imposed stress conditions may be terminated at electronic speeds, thereby preventing destruction of the device under test. The system includes stress channels each paired with a control and monitor circuit, such that the control and monitor circuit may shut down the stress if a limiting stress level is detected by the control and monitor circuit. A microprocessor is used to communicate via a digital control bus with each of the paired stress channels and control and monitor circuits to determine the status of the stress channel; control the stress input; and enable or disable the control and monitor circuits. A computer is used to communicate with the microprocessor through a serial interface.