Patents by Inventor Nicholas John Weston

Nicholas John Weston has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20240012143
    Abstract: An optical distance measurement or ranging apparatus, the apparatus including at least one optical pulse generator for generating a train of gating pulses and a train of probe pulses, the train of gating pulses having a different repetition rate than the train of probe pulses. The gating and probe pulses may be ultrashort laser pulses generated by different free-running, mode-locked lasers. An optical probing arrangement for directing the train of probe pulses to one or more objects and for collecting returned probe pulses returned from the one or more objects. The objects may include a target object and a reference object. The apparatus includes a multi-photon effect detector and is configured to direct both the train of gating pulses and the returned probe pulses to the multi-photon effect detector. The apparatus may be used for industrial inspection, machine calibration, position measurement or the like.
    Type: Application
    Filed: December 1, 2021
    Publication date: January 11, 2024
    Applicant: RENISHAW PLC
    Inventors: Nicholas John WESTON, Derryck Telford REID, Hollie WRIGHT
  • Patent number: 11123799
    Abstract: This invention concerns an additive manufacturing apparatus for building objects by layerwise consolidation of material. The apparatus comprises a build chamber 101 containing a working area, a plurality of high energy beams 133, 233 for consolidating material deposited in the working area in layers and an optical unit 135 for controlling transmission of the high energy beams onto material in the working area. The optical unit 135 comprises a plurality of independently controllable optical elements 141, 241 each optical element 141, 241 for controlling transmission of at least one of the high energy beams onto the material in the working area, the optical unit 135 movable in the build chamber 101.
    Type: Grant
    Filed: July 10, 2019
    Date of Patent: September 21, 2021
    Assignee: RENISHAW PLC
    Inventors: David Roberts McMurtry, Geoffrey McFarland, Nicholas John Weston, Ben Ian Ferrar
  • Patent number: 11105607
    Abstract: A method of putting a feature of interest on an object and an optical inspection system of a non-contact probe mounted on a positioning apparatus in a desired relationship. The method includes: a) identifying a target point of interest on the object to be inspected by arranging the non-contact probe and object at a first relative configuration at which a marker feature, projected by the non-contact probe along a projector axis that is not coaxial with the optical inspection system's optical axis, identifies the target point of interest; and b) subsequently moving the non-contact probe and/or object so as to put them at a second relative configuration at which the target point of interest and optical inspection system are at the desired relationship, in which the positioning apparatus is configured to guide such motion in accordance with the control path.
    Type: Grant
    Filed: July 26, 2017
    Date of Patent: August 31, 2021
    Assignee: RENISHAW PLC
    Inventors: Nicholas John Weston, Yvonne Ruth Huddart
  • Publication number: 20210229215
    Abstract: A laser beam scanner including a laser beams positioning optic, a plurality of optical fibres for delivering a plurality of laser beams and a fibre termination optic aligned to direct the laser beams from output ends of the plurality of optical fibres to the laser beams positioning optic. The laser beams positioning optic is movable relative to the fibre termination optic to scan the laser beams across a working surface.
    Type: Application
    Filed: May 15, 2019
    Publication date: July 29, 2021
    Applicant: RENISHAW PLC
    Inventors: Nicholas John WESTON, Geoffrey MCFARLAND
  • Publication number: 20200233377
    Abstract: A method and system for forming a holographic structure in a material. The holographic structure is configured to project a selected target image in the far field under illumination of the holographic structure by a laser. The method calculates a modified design for the holographic structure that encodes a unique identifier within the holographic structure for projecting the target image. The method modifies the material by mapping features corresponding to the modified design into the material so as to form the holographic structure. A basic check of the authenticity of the material is performed by checking whether a projected replica of the target image is as expected. A more detailed check of the authenticity of the material is performed by directly inspecting the features in the holographic structure.
    Type: Application
    Filed: October 16, 2018
    Publication date: July 23, 2020
    Applicant: RENISHAW PLC
    Inventors: Nicholas John WESTON, Duncan Paul HAND, Krystian Lukasz WLODARCZYK
  • Publication number: 20190329323
    Abstract: This invention concerns an additive manufacturing apparatus for building objects by layerwise consolidation of material. The apparatus comprises a build chamber 101 containing a working area, a plurality of high energy beams 133, 233 for consolidating material deposited in the working area in layers and an optical unit 135 for controlling transmission of the high energy beams onto material in the working area. The optical unit 135 comprises a plurality of independently controllable optical elements 141, 241 each optical element 141, 241 for controlling transmission of at least one of the high energy beams onto the material in the working area, the optical unit 135 movable in the build chamber 101.
    Type: Application
    Filed: July 10, 2019
    Publication date: October 31, 2019
    Applicant: RENISHAW PLC
    Inventors: David Roberts MCMURTRY, Geoffrey MCFARLAND, Nicholas John WESTON, Ben Ian FERRAR
  • Patent number: 10399145
    Abstract: An additive manufacturing apparatus for building objects by layerwise consolidation of material. The apparatus includes a build chamber containing a working area, a plurality of high energy beams for consolidating material deposited in the working area in layers and an optical unit for controlling transmission of the high energy beams onto material in the working area. The optical unit includes a plurality of independently controllable optical elements each optical element for controlling transmission of at least one of the high energy beams onto the material in the working area, the optical unit movable in the build chamber.
    Type: Grant
    Filed: June 11, 2014
    Date of Patent: September 3, 2019
    Assignee: RENISHAW PLC
    Inventors: David Roberts McMurtry, Geoffrey McFarland, Nicholas John Weston, Ben Ian Ferrar
  • Publication number: 20190154430
    Abstract: A method of putting a feature of interest on an object and an optical inspection system of a non-contact probe mounted on a positioning apparatus in a desired relationship. The method includes: a) identifying a target point of interest on the object to be inspected by arranging the non-contact probe and object at a first relative configuration at which a marker feature, projected by the non-contact probe along a projector axis that is not coaxial with the optical inspection system's optical axis, identifies the target point of interest; and b) subsequently moving the non-contact probe and/or object so as to put them at a second relative configuration at which the target point of interest and optical inspection system are at the desired relationship, in which the positioning apparatus is configured to guide such motion in accordance with the control path.
    Type: Application
    Filed: July 26, 2017
    Publication date: May 23, 2019
    Applicant: RENISHAW PLC
    Inventors: Nicholas John WESTON, Yvonne Ruth HUDDART
  • Patent number: 10226840
    Abstract: A method of forming an optical device comprises applying a laser beam to a target area of the surface so as to selectively heat material of the surface thereby to provide transfer of material due to a surface tension gradient, wherein the surface is such that, when liquid, parts of the surface at higher temperatures have a higher surface tension than adjacent parts of the surface at lower temperatures.
    Type: Grant
    Filed: September 26, 2011
    Date of Patent: March 12, 2019
    Assignee: RENISHAW PLC
    Inventors: Nicholas John Weston, Duncan Paul Hand, Stephanie Giet, Marcus Ardron
  • Patent number: 9945697
    Abstract: A measurement scale device includes at least one scale marking, wherein the or each scale marking includes at least one periodic nanostructure that represents scale device information.
    Type: Grant
    Filed: January 13, 2014
    Date of Patent: April 17, 2018
    Assignee: RENISHAW PLC
    Inventors: Matthew Donald Kidd, Nicholas John Weston, James Reynolds Henshaw, Marcus Ardron, John Dardis, Robert Thomson
  • Patent number: 9841300
    Abstract: A measurement scale device includes at least one scale marking, wherein the or each scale marking includes at least one periodic nanostructure that represents scale device information.
    Type: Grant
    Filed: January 13, 2014
    Date of Patent: December 12, 2017
    Assignee: RENISHAW PLC
    Inventors: Matthew Donald Kidd, Nicholas John Weston, James Reynolds Henshaw, Marcus Ardron, John Dardis, Robert Thomson
  • Patent number: 9618329
    Abstract: An optical inspection probe for obtaining and providing images of an object to be inspected. The optical inspection probe comprises an imaging assembly for capturing an image of an object and an illumination assembly for producing a light beam directed toward the object. The optical inspection probe is configured such that the light beam converges to a focal point at a first focal plane.
    Type: Grant
    Filed: May 19, 2009
    Date of Patent: April 11, 2017
    Assignee: RENISHAW PLC
    Inventors: Nicholas John Weston, Alexander David McKendrick
  • Publication number: 20160136730
    Abstract: An additive manufacturing apparatus for building objects by layerwise consolidation of material. The apparatus includes a build chamber containing a working area, a plurality of high energy beams for consolidating material deposited in the working area in layers and an optical unit for controlling transmission of the high energy beams onto material in the working area. The optical unit includes a plurality of independently controllable optical elements each optical element for controlling transmission of at least one of the high energy beams onto the material in the working area, the optical unit movable in the build chamber.
    Type: Application
    Filed: June 11, 2014
    Publication date: May 19, 2016
    Applicant: RENISHAW PLC
    Inventors: David Roberts MCMURTRY, Geoffrey MCFARLAND, Nicholas John WESTON, Ben Ian FERRAR
  • Patent number: 9329030
    Abstract: A non-contact method of inspecting the topography of an area of an object via analysis of the phase of a pattern projected on the object. The method includes taking a first image of the object, obtained from a first perspective, on which an optical pattern is projected, and taking a second image of the object, obtained from a second perspective, on which an optical pattern is projected but in which the optical pattern, as it falls on the object, in the second image differs to that in the first image. The method further includes determining data describing the topography of at least a region of the object based on phase data relating to the phase of at least a region of the optical pattern as imaged in the first image. Phase data obtained from a corresponding region of the object as imaged in the second image is used to resolve any ambiguity in the phase or topography data obtained from the first image.
    Type: Grant
    Filed: September 6, 2010
    Date of Patent: May 3, 2016
    Assignee: RENISHAW PLC
    Inventors: Nicholas John Weston, Yvonne Ruth Huddart
  • Publication number: 20150369637
    Abstract: A measurement scale device includes at least one scale marking, wherein the or each scale marking includes at least one periodic nanostructure that represents scale device information.
    Type: Application
    Filed: January 13, 2014
    Publication date: December 24, 2015
    Inventors: Matthew Donald KIDD, Nicholas John WESTON, James Reynolds HENSHAW, Marcus ARDRON, John DARDIS, Robert THOMSON
  • Publication number: 20150339505
    Abstract: A method of reading data represented by a marking including at least one periodic nanostructure, the marking representing data using a polarisation property of the periodic nanostructure. The method includes detecting polarised electromagnetic radiation reflected from or transmitted by the nanostructure, and determining the data represented by the marking from the detected polarised electromagnetic radiation, wherein the method further includes applying polarised electromagnetic radiation to the nanostructure, and/or the detecting is performed using a polarisation-sensitive detector apparatus.
    Type: Application
    Filed: January 13, 2014
    Publication date: November 26, 2015
    Inventors: Matthew Donald KIDD, Nicholas John WESTON, James Reynolds HENSHAW, Marcus ARDRON, John DARDIS, Robert THOMSON
  • Patent number: 8978261
    Abstract: A measurement system has a surface sensing device mounted on an articulating probe head, which in turn is mounted on a coordinate positioning apparatus. The surface sensing device is moved relative to a surface by driving at least one of the coordinate positioning apparatus and probe head in at least one axis to scan the surface. The surface sensing device measures its distance from the surface and the probe head is driven to rotate the surface sensing device about at least one axis in order to control the relative position of the surface sensing device from the surface to within a predetermined range in real time.
    Type: Grant
    Filed: July 21, 2011
    Date of Patent: March 17, 2015
    Assignee: Renishaw PLC
    Inventors: Geoffrey McFarland, Kenneth Cheng Hoe Nai, Nicholas John Weston, Ian William McLean
  • Patent number: 8939008
    Abstract: A method of calibrating an articulating probe head comprising the steps of measuring an artifact of known dimensions with the workpiece sensing probe mounted on the articulating probe head, in which the articulating probe head is unlocked. An error functional map is generated corresponding to the difference between the measured and known dimensions of the artifact. Subsequent workpieces are measured with the articulating probe head unlocked and the corresponding correction applied. The true dimensions of the artifact may be determined by measuring it with a probe mounted on an articulating probe head in which the axes of the articulating probe head are locked. A mechanical lock is provided to lock the axes of the articulating probe head.
    Type: Grant
    Filed: July 20, 2011
    Date of Patent: January 27, 2015
    Assignee: Renishaw PLC
    Inventors: David Roberts McMurtry, Geoff McFarland, Kenneth Cheng-Hoe Nai, Stephen James Trull, Nicholas John Weston
  • Patent number: 8923603
    Abstract: A non-contact method and apparatus for inspecting an object. At least one first image of the object on which an optical pattern is projected, taken from a first perspective is obtained. At least one second image of the object on which an optical pattern is projected, taken from a second perspective that is different to the first perspective is obtained. At least one common object feature in each of the at least one first and second images is then determined on the basis of an irregularity in the optical pattern as imaged in the at least one first and second images.
    Type: Grant
    Filed: August 15, 2008
    Date of Patent: December 30, 2014
    Assignee: Renishaw PLC
    Inventors: Nicholas John Weston, Yvonne Ruth Huddart, Andrew John Moore
  • Patent number: RE46012
    Abstract: A non-contact measurement apparatus and method. A probe is provided for mounting on a coordinate positioning apparatus, comprising at least one imaging device for capturing an image of an object to be measured. Also provided is an image analyzer configured to analyze at least one first image of an object obtained by the probe from a first perspective and at least one second image of the object obtained by the probe from a second perspective so as to identify at least one target feature on the object to be measured. The image analyzer is further configured to obtain topographical data regarding a surface of the object via analysis of an image, obtained by the probe, of the object on which an optical pattern is projected.
    Type: Grant
    Filed: December 5, 2014
    Date of Patent: May 24, 2016
    Assignee: RENISHAW PLC
    Inventors: Nicholas John Weston, Yvonne Ruth Huddart