Patents by Inventor Nicholas Liptay-Wagner

Nicholas Liptay-Wagner has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 5687930
    Abstract: An improved system is provided suitable for use in landing an aircraft (for example, helicopter, RPV, VTOL) on shipboard comprising a support, base, platform or housing, reciprocal from remote a landing area on the deck of a ship to a position proximate the landing area, the housing carrying an upwardly directed light sensor comprising a lens system and a pair of band-pass filters, one filter before the lens system of the sensor and one after the lens system, the filters each passing the identical wavelength of light at its center but which each need not have the same band width as the other, a pulse detector in close proximity to the upwardly directed light sensor, and means for securing the aircraft to the support, housing, base or platform.
    Type: Grant
    Filed: April 10, 1992
    Date of Patent: November 18, 1997
    Assignee: Indal Technologies Inc.
    Inventors: Nicholas Liptay Wagner, Geoffrey Cunliffe
  • Patent number: 5004339
    Abstract: A method of determining physical characteristics of a surface. Light or other electromagnetic radiation is directed onto a first portion of a surface and the reflected radiation is received such as by a photodiode. The radiation is also directed onto at least two further portions of the surface and located on either side of the proximate to the first portion. The radiation reflected by the further portions is also received. The radiation reflected from the first portion is compared with the radiation reflected from the two further portions. The radiation and comparison steps are repeated and the comparisons are used to determine a physical characteristic of the surface, such as the presence of one or more flaws. In another embodiment, light or other electromagnetic radiation is used to determine object dimension, such as bore dimension.
    Type: Grant
    Filed: December 22, 1986
    Date of Patent: April 2, 1991
    Assignee: Diffracto Ltd.
    Inventors: Timothy R. Pryor, Omer L. Hageniers, Walter J. Pastorius, Nicholas Liptay-Wagner, Donald A. Clarke
  • Patent number: 4686374
    Abstract: A method an apparatus are provided for inspecting the surface of objects such as panels for automobile vehicles wherein the surface of the object is sprayed with an oil mist or the like to increase the reflectivity thereof. The surface is then illuminated with light so that the light image reflected therefrom is formed on a light detector such as a photodiode array. The output of the light detector is analyzed to determine surface features of the object such as "dings" and dents therein.
    Type: Grant
    Filed: October 16, 1985
    Date of Patent: August 11, 1987
    Assignee: Diffracto Ltd.
    Inventors: Nicholas Liptay-Wagner, Roland Renaud, Timothy R. Pryor, Donald A. Clarke
  • Patent number: 4585947
    Abstract: This invention relates to new and useful electro-optical methods and apparatus using photodetector arrays for measurement of parts and other objects in industrial environments. Several particularly useful optical embodiments are illustrated together with desirable electronic circuitry for improving the accuracy of practical systems of this type.
    Type: Grant
    Filed: February 25, 1983
    Date of Patent: April 29, 1986
    Assignee: Diffracto, Ltd.
    Inventors: Nicholas Liptay-Wagner, Roland Renaud, Timothy R. Pryor, Donald A. Clarke
  • Patent number: 4506980
    Abstract: A method of determining physical characteristics of a surface. Light or other electromagnetic radiation is directed onto a first portion of a surface and the reflected radiation is received such as by a photodiode. The radiation is also directed onto at least two further portions of the surface and located on either side of and proximate to the first portion. The radiation reflected by the further portions is also received. The radiation reflected from the first portion is compared with the radiation reflected from the two further portions. The radiation and comparison steps are repeated and the comparisons are used to determine a physical characteristic of the surface, such as the presence of one or more flaws. In another embodiment, light or other electromagnetic radiation is used to determine object dimension, such as bore dimension.
    Type: Grant
    Filed: August 24, 1981
    Date of Patent: March 26, 1985
    Assignee: Diffracto Ltd.
    Inventors: Timothy R. Pryor, Omer L. Hageniers, Walter J. Pastorius, Nicholas Liptay-Wagner, Donald A. Clarke
  • Patent number: 4493554
    Abstract: A method of determining physical characteristics of a surface. Light or other electromagnetic radiation is directed onto a first portion of a surface and the reflected radiation is received such as by a photodiode. The radiation is also directed onto at least two further portions of the surface and located on either side of and proximate to the first portion. The radiation reflected by the further portions is also received. The radiation reflected from the first portion is compared with the radiation reflected from the two further portions. The radiation and comparison steps are repeated and the comparisons are used to determine a physical characteristic of the surface, such as the presence of one or more flaws. In another embodiment, light or other electromagnetic radiation is used to determine object dimension, such as bore dimension.
    Type: Grant
    Filed: August 24, 1981
    Date of Patent: January 15, 1985
    Assignee: Diffracto
    Inventors: Timothy R. Pryor, Omer L. Hageniers, Walter J. Pastorius, Nicholas Liptay-Wagner, Donald A. Clarke
  • Patent number: 4465374
    Abstract: Method and apparatus for determining dimensional information concerning an object. A ring of light is directed onto an object surface such that at least a portion of the ring of light is incident upon the object surface. An image is formed of the incident light reflected from the surface. The width or position of the image is determined. The location of the surface is determined from the image width or position, and dimensional information about the object is determined from the surface location.
    Type: Grant
    Filed: December 10, 1982
    Date of Patent: August 14, 1984
    Assignee: Diffracto Ltd.
    Inventors: Timothy R. Pryor, Omer L. Hageniers, Walter J. Pastorius, Nicholas Liptay-Wagner, Donald A. Clarke
  • Patent number: 4394683
    Abstract: A method and apparatus are provided for analyzing the light pattern produced on a photodetector array. The signal produced by the array is filtered with a low pass filter and the output of the filter is differentiated to obtain either the first or second derivative of the filtered signal for one or more points in the pattern. The zero crossing of the differentiated signal is detected and the zero crossing point is timed relative to a further point, e.g., the start of the scan of the array, so as to obtain an output related to the position of the corresponding point or points in the pattern.
    Type: Grant
    Filed: June 26, 1980
    Date of Patent: July 19, 1983
    Assignee: Diffracto Ltd.
    Inventors: Nicholas Liptay-Wagner, Roland Renaud, Timothy R. Pryor, Donald A. Clarke
  • Patent number: 4326808
    Abstract: A method and apparatus is disclosed for determining physical characteristics, such as defects, in the outer surface of an elongate object, wherein the object to be inspected passes through an aperture of a mirror surface which is a conical surface of revolution. Light directed onto the mirror surface in an axial direction is reflected by the object surface, imaged, and analyzed to determine a physical characteristic of the object surface.
    Type: Grant
    Filed: February 27, 1979
    Date of Patent: April 27, 1982
    Assignee: Diffracto Ltd.
    Inventors: Timothy R. Pryor, Omer L. Hageniers, Walter J. Pastorius, Nicholas Liptay-Wagner, Donald A. Clarke, Blaine Richards
  • Patent number: 4305661
    Abstract: A method of determining physical characteristics of a surface. Light or other electromagnetic radiation is directed onto a first portion of a surface and the reflected radiation is received such as by a photodiode. The radiation is also directed onto at least two further portions of the surface and located on either side of and proximate to the first portion. The radiation reflected by the further portions is also received. The radiation reflected from the first portion is compared with the radiation reflected from the two further portions. The radiation and comparison steps are repeated and the comparisons are used to determine a physical characteristic of the surface, such as the presence of one or more flaws. In another embodiment, light or other electromagnetic radiation is used to determine object dimension, such as bore dimension.
    Type: Grant
    Filed: February 27, 1979
    Date of Patent: December 15, 1981
    Assignee: Diffracto, Ltd.
    Inventors: Timothy R. Pryor, Omer L. Hageniers, Walter J. Pastorius, Nicholas Liptay-Wagner, Donald A. Clarke