Patents by Inventor Nicholas Roberts Kyele

Nicholas Roberts Kyele has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9040930
    Abstract: A particle beam sensor comprising: scattering means providing a surface for intercepting obliquely a path of a particle beam thereby to permit a scattering of particles from the particle beam by the scattering means; sensor means responsive to receipt of one or more said scattered particles to generate a sensor signal; aperture mask means arranged between the scattering means and the sensor means to present to the scattering means a screen opaque to said scattered particles and having at least one aperture through which an unobstructed view of the scattering means is provided to the sensor means, the aperture (s) thereby permitting selection of all of those particles scattered by the scattering means which may be used to form at the sensor means an image representative of at least a part of a foot print cast by the particle beam upon the scattering means. By scattering particles from a sectional area of a particle beam, scattered beam particles can be used more efficiently compared to existing techniques.
    Type: Grant
    Filed: June 18, 2009
    Date of Patent: May 26, 2015
    Assignee: THE UNIVERSITY OF MANCHESTER
    Inventors: Nicholas Roberts Kyele, Roelof Gozewijn Van Silfhout
  • Publication number: 20110168903
    Abstract: A particle beam sensor comprising: scattering means providing a surface for intercepting obliquely a path of a particle beam thereby to permit a scattering of particles from the particle beam by the scattering means; sensor means responsive to receipt of one or more said scattered particles to generate a sensor signal; aperture mask means arranged between the scattering means and the sensor means to present to the scattering means a screen opaque to said scattered particles and having at least one aperture through which an unobstructed view of the scattering means is provided to the sensor means, the aperture (s) thereby permitting selection of all of those particles scattered by the scattering means which may be used to form at the sensor means an image representative of at least a part of a foot print cast by the particle beam upon the scattering means. By scattering particles from a sectional area of a particle beam, scattered beam particles can be used more efficiently compared to existing techniques.
    Type: Application
    Filed: June 18, 2009
    Publication date: July 14, 2011
    Inventors: Nicholas Roberts Kyele, Roelof Gozewijn Van Silfhout