Patents by Inventor Nicholas Wiswell

Nicholas Wiswell has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11701749
    Abstract: A chemical mechanical polishing apparatus includes a platen to support a polishing pad, the platen having a recess, a flexible membrane in the recess, and an in-situ vibration monitoring system to generate a signal. The in-situ acoustic monitoring system includes a vibration sensor supported by the flexible membrane and positioned to couple to an underside of the polishing pad.
    Type: Grant
    Filed: March 13, 2019
    Date of Patent: July 18, 2023
    Assignee: Applied Materials, Inc.
    Inventors: Boguslaw A. Swedek, Dominic J. Benvegnu, Chih Chung Chou, Nicholas Wiswell, Thomas H. Osterheld, Jeonghoon Oh
  • Patent number: 11660722
    Abstract: A chemical mechanical polishing system includes a platen to support a polishing pad, a carrier head to hold a substrate and bring a lower surface of the substrate into contact with the polishing pad, and an in-situ friction monitoring system including a friction sensor. The friction sensor includes a pad portion having a substrate contacting portion with an upper surface to contact the lower surface of the substrate, and a pair of capacitive sensors positioned below and on opposing sides of the substrate contacting portion.
    Type: Grant
    Filed: July 25, 2019
    Date of Patent: May 30, 2023
    Assignee: Applied Materials, Inc.
    Inventors: Nicholas Wiswell, Chih Chung Chou, Dominic J. Benvegnu
  • Patent number: 11651207
    Abstract: A method of generating training spectra for training of a neural network includes measuring a first plurality of training spectra from one or more sample substrates, measuring a characterizing value for each training spectra of the plurality of training spectra to generate a plurality of characterizing values with each training spectrum having an associated characterizing value, measuring a plurality of dummy spectra during processing of one or more dummy substrates, and generating a second plurality of training spectra by combining the first plurality of training spectra and the plurality of dummy spectra, there being a greater number of spectra in the second plurality of training spectra than in the first plurality of training spectra. Each training spectrum of the second plurality of training spectra having an associated characterizing value.
    Type: Grant
    Filed: June 21, 2019
    Date of Patent: May 16, 2023
    Assignee: Applied Materials, Inc.
    Inventors: Benjamin Cherian, Nicholas Wiswell, Jun Qian, Thomas H. Osterheld
  • Patent number: 11577356
    Abstract: During chemical mechanical polishing of a substrate, a signal value that depends on a thickness of a layer in a measurement spot on a substrate undergoing polishing is determined by a first in-situ monitoring system. An image of at least the measurement spot of the substrate is generated by a second in-situ imaging system. Machine vision processing, e.g., a convolutional neural network, is used to determine a characterizing value for the measurement spot based on the image. Then a measurement value is calculated based on both the characterizing value and the signal value.
    Type: Grant
    Filed: August 28, 2019
    Date of Patent: February 14, 2023
    Assignee: Applied Materials, Inc.
    Inventors: Benjamin Cherian, Jun Qian, Nicholas Wiswell, Dominic J. Benvegnu, Boguslaw A. Swedek, Thomas H. Osterheld
  • Patent number: 11507824
    Abstract: A method of generating training spectra for training of a neural network includes generating a plurality of theoretically generated initial spectra from an optical model, sending the plurality of theoretically generated initial spectra to a feedforward neural network to generate a plurality of modified theoretically generated spectra, sending an output of the feedforward neural network and empirically collected spectra to a discriminatory convolutional neural network, determining that the discriminatory convolutional neural network does not discriminate between the modified theoretically generated spectra and empirically collected spectra, and thereafter, generating a plurality of training spectra from the feedforward neural network.
    Type: Grant
    Filed: June 21, 2019
    Date of Patent: November 22, 2022
    Assignee: Applied Materials, Inc.
    Inventors: Benjamin Cherian, Nicholas Wiswell, Jun Qian, Thomas H. Osterheld
  • Publication number: 20200094370
    Abstract: During chemical mechanical polishing of a substrate, a signal value that depends on a thickness of a layer in a measurement spot on a substrate undergoing polishing is determined by a first in-situ monitoring system. An image of at least the measurement spot of the substrate is generated by a second in-situ imaging system. Machine vision processing, e.g., a convolutional neural network, is used to determine a characterizing value for the measurement spot based on the image. Then a measurement value is calculated based on both the characterizing value and the signal value.
    Type: Application
    Filed: August 28, 2019
    Publication date: March 26, 2020
    Inventors: Benjamin Cherian, Jun Qian, Nicholas Wiswell, Dominic J. Benvegnu, Boguslaw A. Swedek, Thomas H. Osterheld
  • Publication number: 20200070306
    Abstract: A chemical mechanical polishing system includes a platen to support a polishing pad, a carrier head to hold a substrate and bring a lower surface of the substrate into contact with the polishing pad, and an in-situ friction monitoring system including a friction sensor. The friction sensor includes a pad portion having a substrate contacting portion with an upper surface to contact the lower surface of the substrate, and a pair of capacitive sensors positioned below and on opposing sides of the substrate contacting portion.
    Type: Application
    Filed: July 25, 2019
    Publication date: March 5, 2020
    Inventors: Nicholas Wiswell, Chih Chung Chou, Dominic J. Benvegnu
  • Publication number: 20200005139
    Abstract: A method of generating training spectra for training of a neural network includes measuring a first plurality of training spectra from one or more sample substrates, measuring a characterizing value for each training spectra of the plurality of training spectra to generate a plurality of characterizing values with each training spectrum having an associated characterizing value, measuring a plurality of dummy spectra during processing of one or more dummy substrates, and generating a second plurality of training spectra by combining the first plurality of training spectra and the plurality of dummy spectra, there being a greater number of spectra in the second plurality of training spectra than in the first plurality of training spectra. Each training spectrum of the second plurality of training spectra having an associated characterizing value.
    Type: Application
    Filed: June 21, 2019
    Publication date: January 2, 2020
    Inventors: Benjamin Cherian, Nicholas Wiswell, Jun Qian, Thomas H. Osterheld
  • Publication number: 20200005140
    Abstract: A method of generating training spectra for training of a neural network includes generating a plurality of theoretically generated initial spectra from an optical model, sending the plurality of theoretically generated initial spectra to a feedforward neural network to generate a plurality of modified theoretically generated spectra, sending an output of the feedforward neural network and empirically collected spectra to a discriminatory convolutional neural network, determining that the discriminatory convolutional neural network does not discriminate between the modified theoretically generated spectra and empirically collected spectra, and thereafter, generating a plurality of training spectra from the feedforward neural network.
    Type: Application
    Filed: June 21, 2019
    Publication date: January 2, 2020
    Inventors: Benjamin Cherian, Nicholas Wiswell, Jun Qian, Thomas H. Osterheld
  • Publication number: 20190283204
    Abstract: A chemical mechanical polishing apparatus includes a platen to support a polishing pad, the platen having a recess, a flexible membrane in the recess, and an in-situ vibration monitoring system to generate a signal. The in-situ acoustic monitoring system includes a vibration sensor supported by the flexible membrane and positioned to couple to an underside of the polishing pad.
    Type: Application
    Filed: March 13, 2019
    Publication date: September 19, 2019
    Inventors: Boguslaw A. Swedek, Dominic J. Benvegnu, Chih Chung Chou, Nicholas Wiswell, Thomas H. Osterheld, Jeonghoon Oh