Patents by Inventor Nicholas Wright

Nicholas Wright has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20260069604
    Abstract: Described herein are equilibrative nucleoside transporter inhibitors and methods of making and using same. In some embodiments, the inhibitors are used for the prevention and/or treatment of pain.
    Type: Application
    Filed: June 1, 2023
    Publication date: March 12, 2026
    Inventors: Seok-Yong Lee, Jiyong Hong, Ru-Rong Ji, Nicholas Wright
  • Patent number: 10159248
    Abstract: The present invention provides natural and/or simulated, synthetic, synergistic pesticidal compositions comprising terpenes, such as extracts from Chenopodium ambrosioides near ambrosioides, or compositions based on those found in Chenopodium ambrosioides near ambrosioides. The present invention also provides methods of using said compositions to kill, inhibit, prevent and/or repel plant pests from contacting and/or damaging plants.
    Type: Grant
    Filed: February 22, 2016
    Date of Patent: December 25, 2018
    Assignee: Bayer CropScience LP
    Inventors: Desmond Jimenez, Giselle Janssen, Dennis Long, Brett Highland, Tara Lu, Gerardo Bueno, Nicholas Wright
  • Publication number: 20080029384
    Abstract: An electrochemical device including: (a) a semiconductor layer, wherein the semiconductor is silicon or silicon carbide, and where the layer has a thickness from 1 to 1000 ?m; (b) a TiO2 layer on the semiconductor layer, where the layer may include an alkaline earth oxide MO up to an amount where the layer is MtiO3, and where the layer has a thickness from 5 nm to 1 mm; (c) a grid of inert metal on the TiO2 layer, arranged so as to be able to apply a electric field across the TiO2 layer; and (d) an ohmic contact on the semiconductor layer.
    Type: Application
    Filed: September 2, 2005
    Publication date: February 7, 2008
    Inventors: Paul Christensen, Nicholas Wright, Terrence Egerton
  • Publication number: 20060273323
    Abstract: A semiconductor device includes: a SiC substrate; a silicide layer disposed on the SiC substrate; and a carbide layer disposed on the silicide layer. The silicide layer includes a first metal, and the carbide layer includes a second metal. The first metal is Ni or Ni alloy, and the second metal is Ti, Ta or W. The device provides excellent ohmic contact and high quality surface metallization construction.
    Type: Application
    Filed: June 7, 2006
    Publication date: December 7, 2006
    Applicants: DENSO CORPORATION, The University of Newcastle upon Tyne
    Inventors: Takeo Yamamoto, Malhan Kumar, Yuuichi Takeuchi, Konstantin Vassilevski, Nicholas Wright
  • Patent number: 7141498
    Abstract: A method of forming an ohmic contact on a substrate composed of a wide-band gap semiconductor material includes: depositing a transition metal group metal on the substrate; annealing the substrate at a high temperature to cause a solid state chemical reaction between the substrate and the deposited metal that forms a modified layer in the substrate having modified properties different than the substrate, and by-products composed of a silicide and a nanocrystalline graphite layer; selectively etching the substrate to remove one or more of the by-products of the solid state chemical reaction from a surface of the substrate; and depositing a metal film composed of a transition group metal over the modified layer on the substrate to form the ohmic contact. The modified layer permits formation of the ohmic contact without high temperature annealing after depositing the metal film.
    Type: Grant
    Filed: June 23, 2005
    Date of Patent: November 28, 2006
    Assignees: Denso Corporation, The University of Newcastle upon Tyne
    Inventors: Rajesh Kumar Malhan, Yuichi Takeuchi, Irina Nikitina, Konstantin Vassilevski, Nicholas Wright, Alton Horsfall
  • Publication number: 20060205195
    Abstract: A method of forming an ohmic contact on a substrate composed of a wide-band gap semiconductor material includes: depositing a transition metal group metal on the substrate; annealing the substrate at a high temperature to cause a solid state chemical reaction between the substrate and the deposited metal that forms a modified layer in the substrate having modified properties different than the substrate, and by-products composed of a silicide and a nanocrystalline graphite layer; selectively etching the substrate to remove one or more of the by-products of the solid state chemical reaction from a surface of the substrate; and depositing a metal film composed of a transition group metal over the modified layer on the substrate to form the ohmic contact. The modified layer permits formation of the ohmic contact without high temperature annealing after depositing the metal film.
    Type: Application
    Filed: June 23, 2005
    Publication date: September 14, 2006
    Inventors: Rajesh Malhan, Yuichi Takeuchi, Irina Nikitina, Konstantin Vassilevski, Nicholas Wright, Alton Horsfall