Abstract: A miniature component carrier includes a thin, resilient mask through which are formed multiple spaced-apart apertures each of which is sized and shaped to compliantly receive and hold a miniature component in a controlled orientation during termination processing such that the side margins of the aperture primarily contact and grip the corner regions of the miniature component. At least some of the apertures have side margins that form rhomboidal or elliptical apertures. The shape and size of the multiple spaced-apart apertures confine within an operational tolerance contact between the side margins of the aperture and the side or end wall surfaces of the electronic component. This reduces mechanical damage to the side and end wall surfaces that results from their contact with the side margins during receipt and gripping of the miniature component in the aperture.

Abstract: A miniature component carrier includes a thin, resilient mask through which are formed multiple spaced-apart apertures each of which is sized and shaped to compliantly receive and hold a miniature component in a controlled orientation during termination processing such that the side margins of the aperture primarily contact and grip the corner regions of the miniature component. At least some of the apertures have side margins that form rhomboidal or elliptical apertures. The shape and size of the multiple spaced-apart apertures confine within an operational tolerance contact between the side margins of the aperture and the side or end wall surfaces of the electronic component. This reduces mechanical damage to the side and end wall surfaces that results from their contact with the side margins during receipt and gripping of the miniature component in the aperture.

Abstract: A miniature component carrier includes a thin, resilient mask through which are formed multiple spaced-apart apertures each of which is sized and shaped to compliantly receive and hold a miniature component in a controlled orientation during termination processing such that the side margins of the aperture primarily contact and grip the corner regions of the miniature component. At least some of the apertures have side margins that form rhomboidal or elliptical apertures. The shape and size of the multiple spaced-apart apertures confine within an operational tolerance contact between the side margins of the aperture and the side or end wall surfaces of the electronic component. This reduces mechanical damage to the side and end wall surfaces that results from their contact with the side margins during receipt and gripping of the miniature component in the aperture.

Abstract: A component loader orients a component along its long-axis for transfer from a rotatable load plate. The load plate has an outer peripheral edge and an upper surface inclined from a horizontal plane. Slots on the upper surface terminate at the outer edge of the load plate and are sized to receive at least one elongate chip lying with its long axis perpendicular to the axis of the load plate and in parallel with radius of the load plate. An outer wall conforms to the curvature of the outer edge and is mounted adjacent thereto. A transfer slot extends axially from and into the upper surface of the load plate on outer ends of the slots and terminates at the outer edge of the load plate. Each transfer slot is shaped so that a chip descending therein from a slot has a ninety degree rotation about the long axis.

Abstract: A compensation tool and process is provided for calibrating each test position located at a plurality of test modules of an electronic testing machine to a standardized value. Each test module is located on an angularly spaced radial line extending from an associated central axis and has a plurality of contacts for testing electronic components. The compensation tool can include a body having an axis of rotation coaxially alignable with the central axis for rotation to different angular positions and a component-support member operably associated with the body for indexing movement to selectively align a pocket with different contacts associated with each test position located at each of the plurality of test modules. The pocket of the component-support member receives an electronic component with terminated ends extending outwardly to allow electrical contact and testing of each test position located at each the plurality of test modules.

Abstract: A component loader orients a component along its long-axis for transfer from a rotatable load plate. The load plate has an outer peripheral edge and an upper surface inclined from a horizontal plane. Slots on the upper surface terminate at the outer edge of the load plate and are sized to receive at least one elongate chip lying with its long axis perpendicular to the axis of the load plate and in parallel with radius of the load plate. An outer wall conforms to the curvature of the outer edge and is mounted adjacent thereto. A transfer slot extends axially from and into the upper surface of the load plate on outer ends of the slots and terminates at the outer edge of the load plate. Each transfer slot is shaped so that a chip descending therein from a slot has a ninety degree rotation about the long axis.

Abstract: A component loader for orienting a component along its long-axis for transfer to transmission means such as a carrier belt. The loader includes a rotatable load plate having an outer peripheral edge and an upper surface where the upper surface is inclined from a horizontal plane. A plurality of slots is on the upper surface, and each is located about the outer edge of the load plate. Each of the plurality of slots is sized to receive at least one chip, preferably lying with its long axis perpendicular to the rotational axis of the rotatable load plate. An outer wall conforms to the curvature of the outer peripheral edge and is mounted adjacent thereabout. A transfer slot extends axially into the upper surface of the load plate. Preferably, each transfer slot is shaped so that a chip descending into each transfer slot from a respective slot has a ninety degree rotation about the long axis.

Abstract: A compensation tool and process is provided for calibrating each test position located at a plurality of test modules of an electronic testing machine to a standardized value. Each test module is located on an angularly spaced radial line extending from an associated central axis and has a plurality of contacts for testing electronic components. The compensation tool can include a body having an axis of rotation coaxially alignable with the central axis for rotation to different angular positions, and a component-support member operably associated with the body for indexing movement to selectively align with different contacts associated with each test position located at each of the plurality of test modules. The component-support member can include a pocket for receiving an electronic component with terminated ends extending outwardly to allow electrical contact and testing of each test position located at each the plurality of test modules.

Abstract: A component loader for orienting a component along its long-axis for transfer to transmission means such as a carrier belt. The loader includes a rotatable load plate having an outer peripheral edge and an upper surface where the upper surface is inclined from a horizontal plane. A plurality of slots is on the upper surface, and each is located about the outer edge of the load plate. Each of the plurality of slots is sized to receive at least one chip, preferably lying with its long axis perpendicular to the rotational axis of the rotatable load plate. An outer wall conforms to the curvature of the outer peripheral edge and is mounted adjacent thereabout. A transfer slot extends axially into the upper surface of the load plate. Preferably, each transfer slot is shaped so that a chip descending into each transfer slot from a respective slot has a ninety degree rotation about the long axis.

Abstract: A miniature component carrier includes a thin, resilient mask through which are formed multiple spaced-apart apertures each of which is sized and shaped to compliantly receive and hold a miniature component in a controlled orientation during termination processing such that the side margins of the aperture primarily contact and grip the corner regions of the miniature component. At least some of the apertures have side margins that form rhomboidal or elliptical apertures. The shape and size of the multiple spaced-apart apertures confine within an operational tolerance contact between the side margins of the aperture and the side or end wall surfaces of the electronic component. This reduces mechanical damage to the side and end wall surfaces that results from their contact with the side margins during receipt and gripping of the miniature component in the aperture.