Patents by Inventor Nick P. ABSALOM

Nick P. ABSALOM has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method and apparatus for analysing particulate material
    Patent number: 11435300
    Abstract: A method and apparatus for analysing particulate material having one or more crystalline substances, the apparatus including: a grinder for receiving a sample extracted from the particulate material and grinding the sample into powdered material having a designated particle size; a measurement station including an X-ray generator for illuminating the powdered material with an X-ray beam and an X-ray detector for detecting X-ray diffraction patterns from the powdered material; a carrier for receiving the powdered material from the grinder and conveying the powdered material through the measurement station; and a processor configured to: receive the X-ray diffraction patterns of the powdered material from the X-ray detector; analyse the X-ray diffraction patterns to determine a series of sequential composition determinations of one or more crystalline substances in the powdered material as the carrier conveys the powdered material through the measurement station; and determine composition of the one or more cry
    Type: Grant
    Filed: May 11, 2018
    Date of Patent: September 6, 2022
    Assignee: FCT ACTECH PTY LTD.
    Inventors: Peter J. Storer, Nick P. Absalom, David S. Rapson, Bogdan A. Iancu, Simon G. Marschall
  • METHOD AND APPARATUS FOR ANALYSING PARTICULATE MATERIAL
    Publication number: 20200182809
    Abstract: A method and apparatus for analysing particulate material having one or more crystalline substances, the apparatus including: a grinder for receiving a sample extracted from the particulate material and grinding the sample into powdered material having a designated particle size; a measurement station including an X-ray generator for illuminating the powdered material with an X-ray beam and an X-ray detector for detecting X-ray diffraction patterns from the powdered material; a carrier for receiving the powdered material from the grinder and conveying the powdered material through the measurement station; and a processor configured to: receive the X-ray diffraction patterns of the powdered material from the X-ray detector; analyse the X-ray diffraction patterns to determine a series of sequential composition determinations of one or more crystalline substances in the powdered material as the carrier conveys the powdered material through the measurement station; and determine composition of the one or more cry
    Type: Application
    Filed: May 11, 2018
    Publication date: June 11, 2020
    Inventors: Peter J. STORER, Nick P. ABSALOM, David S. RAPSON, Bogdan A. IANCU, Simon G. MARSCHALL