Patents by Inventor Nick VERHEUL

Nick VERHEUL has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11994806
    Abstract: A method, computer program and associated apparatuses for metrology. The method includes determining a reconstruction recipe describing at least nominal values for use in a reconstruction of a parameterization describing a target. The method includes obtaining first measurement data relating to measurements of a plurality of targets on at least one substrate, the measurement data relating to one or more acquisition settings and performing an optimization by minimizing a cost function which minimizes differences between the first measurement data and simulated measurement data based on a reconstructed parameterization for each of the plurality of targets. A constraint on the cost function is imposed based on a hierarchical prior. Also disclosed is a hybrid model method comprising obtaining a coarse model operable to provide simulated coarse data; and training a data driven model to correct the simulated coarse data so as to determine simulated data for use in reconstruction.
    Type: Grant
    Filed: February 26, 2020
    Date of Patent: May 28, 2024
    Assignee: ASML NETHERLANDS B.V.
    Inventors: Alexandru Onose, Remco Dirks, Roger Hubertus Elisabeth Clementine Bosch, Sander Silvester Adelgondus Marie Jacobs, Frank Jaco Buijnsters, Siebe Tjerk De Zwart, Artur Palha Da Silva Clerigo, Nick Verheul
  • Publication number: 20240061347
    Abstract: A modular autoencoder model is described. The modular autoencoder model comprises input models configured to process one or more inputs to a first level of dimensionality suitable for combination with other inputs; a common model configured to: reduce a dimensionality of combined processed inputs to generate low dimensional data in a latent space; and expand the low dimensional data in the latent space into one or more expanded versions of the one or more inputs suitable for generating one or more different outputs; output models configured to use the one or more expanded versions of the one or more inputs to generate the one or more different outputs, the one or more different outputs being approximations of the one or more inputs; and a prediction model configured to estimate one or more parameters based on the low dimensional data in the latent space.
    Type: Application
    Filed: December 20, 2021
    Publication date: February 22, 2024
    Applicant: ASML Netherlands B.V.
    Inventors: Alexandru ONOSE, Bart Jacobus Martinus TIEMERSMA, Nick VERHEUL, Remco DIRKS
  • Publication number: 20240060906
    Abstract: A modular autoencoder model is described. The modular autoencoder model comprises input models configured to process one or more inputs to a first level of dimensionality suitable for combination with other inputs; a common model configured to: reduce a dimensionality of combined processed inputs to generate low dimensional data in a latent space; and expand the low dimensional data in the latent space into one or more expanded versions of the one or more inputs suitable for generating one or more different outputs; output models configured to use the one or more expanded versions of the one or more inputs to generate the one or more different outputs, the one or more different outputs being approximations of the one or more inputs; and a prediction model configured to estimate one or more parameters based on the low dimensional data in the latent space.
    Type: Application
    Filed: December 20, 2021
    Publication date: February 22, 2024
    Applicant: ASML Netherlands B.V.
    Inventors: Bart Jacobus Martinus TIEMERSMA, Alexandru ONOSE, Nick VERHEUL, Remco DIRKS
  • Publication number: 20220171290
    Abstract: A method, computer program and associated apparatuses for metrology. The method includes determining a reconstruction recipe describing at least nominal values for use in a reconstruction of a parameterization describing a target. The method includes obtaining first measurement data relating to measurements of a plurality of targets on at least one substrate, the measurement data relating to one or more acquisition settings and performing an optimization by minimizing a cost function which minimizes differences between the first measurement data and simulated measurement data based on a reconstructed parameterization for each of the plurality of targets. A constraint on the cost function is imposed based on a hierarchical prior. Also disclosed is a hybrid model method comprising obtaining a coarse model operable to provide simulated coarse data; and training a data driven model to correct the simulated coarse data so as to determine simulated data for use in reconstruction.
    Type: Application
    Filed: February 26, 2020
    Publication date: June 2, 2022
    Applicant: ASML NETHERLANDS B.V.
    Inventors: Alexandru ONOSE, Remco DIRKS, Roger Hubertus Elisabeth Clementin BOSCH, Sander Silvester Adelgondus Marie JACOBS, Frank Jaco BUIJNSTERS, Siebe Tjerk DE ZWART, Artur PALHA DA SILVA CLERIGO, Nick VERHEUL