Abstract: The present invention relates to a calibration circuit for a band-gap voltage comprising first and second transistors working at different current density, having the base electrodes connected to each other, a first resistance connecting the emitter electrodes of said first and second transistors, said first transistor having a second resistance in series with its emitter electrode, said first and second transistors being connected with a circuitry of transistors, configured as a mirror, characterized by comprising a current source, generating a current in function of the value present in a digital word, composed by “i” bit, connected by means of first and second switches to respective first and second circuit nodes so as to select in which node to insert the current and so as to select the necessary quantity of current to make the calibration.

Abstract: The present invention relates to a calibration circuit for a band-gap voltage comprising first and second transistors working at different current density, having the base electrodes connected to each other, a first resistance connecting the emitter electrodes of said first and second transistors, said first transistor having a second resistance in series with its emitter electrode, said first and second transistors being connected with a circuitry of transistors, configured as a mirror, characterized by comprising a current source, generating a current in function of the value present in a digital word, composed by “i” bit, connected by means of first and second switches to respective first and second circuit nodes so as to select in which node to insert the current and so as to select the necessary quantity of current to make the calibration.