Patents by Inventor Nicolas Daix

Nicolas Daix has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20230358704
    Abstract: In a method for manufacturing an electrochemical gas sensor for sensing a target gas, a semi-manufactured gas sensor is provided. The semi-manufactured gas sensor comprises a substrate supporting an arrangement comprising a thin film of a thickness s?5 pm arranged between a sensing electrode configured to chemically interact with the target gas and a reference electrode facing the substrate. The thin film is an electronically non-conducting and ionically non-conducting ceramic or glass. The arrangement then is heated to an annealing temperature for irreversibly turning the thin film into an ionic conductor by incorporating mobile ions released from the sensing electrode in response to the heating.
    Type: Application
    Filed: September 17, 2021
    Publication date: November 9, 2023
    Inventors: Frank RÖCK, Marc GUBSER, Nicolas DAIX, Lukas BÜRGI, René HUMMEL
  • Patent number: 11209353
    Abstract: An infrared device comprises a substrate. A configuration for emitting infrared radiation is supported by the substrate. The configuration comprises an electrically conducting layer arrangement of less than 50 nm thickness between dielectric layers. In addition, a heater arranged for heating the configuration to emit the infrared radiation is supported by the substrate.
    Type: Grant
    Filed: September 28, 2018
    Date of Patent: December 28, 2021
    Assignee: SENSIRION AG
    Inventors: Nicolas Zäch, Martin Winger, Nicolas Daix, Sebastian Raab, Thomas Uehlinger
  • Publication number: 20200232913
    Abstract: An infrared device comprises a substrate. A configuration for emitting infrared radiation is supported by the substrate. The configuration comprises an electrically conducting layer arrangement of less than 50 nm thickness between dielectric layers. In addition, a heater arranged for heating the configuration to emit the infrared radiation is supported by the substrate.
    Type: Application
    Filed: September 28, 2018
    Publication date: July 23, 2020
    Applicant: SENSIRION AG
    Inventors: Nicolas ZÄCH, Martin WINGER, Nicolas DAIX, Sebastian RAAB, Thomas UEHLINGER
  • Patent number: 9275892
    Abstract: A method of transferring a layer from a donor substrate onto a receiving substrate comprises ionic implantation of at least one species into the donor substrate and forming a layer of concentration of the species intended to form microcavities or platelets; bonding the donor substrate with the receiving substrate by wafer bonding; and splitting at high temperature to split the layer in contact with the receiving substrate by cleavage, at a predetermined cleavage temperature, at the layer of microcavities or platelets formed in the donor substrate. The method further comprises, after the first implantation step and before the splitting step, ionic implantation of silicon ions into the donor substrate to form a layer of concentration of silicon ions in the donor substrate, the layer of concentration of silicon ions at least partially overlapping the layer of concentration of the species intended to form microcavities or platelets.
    Type: Grant
    Filed: November 23, 2011
    Date of Patent: March 1, 2016
    Assignee: SOITEC
    Inventors: Nicolas Daix, Konstantin Bourdelle
  • Publication number: 20130302970
    Abstract: A method of transferring a layer from a donor substrate onto a receiving substrate comprises ionic implantation of at least one species into the donor substrate and forming a layer of concentration of the species intended to form microcavities or platelets; bonding the donor substrate with the receiving substrate by wafer bonding; and splitting at high temperature to split the layer in contact with the receiving substrate by cleavage, at a predetermined cleavage temperature, at the layer of microcavities or platelets formed in the donor substrate. The method further comprises, after the first implantation step and before the splitting step, ionic implantation of silicon ions into the donor substrate to form a layer of concentration of silicon ions in the donor substrate, the layer of concentration of silicon ions at least partially overlapping the layer of concentration of the species intended to form microcavities or platelets.
    Type: Application
    Filed: November 23, 2011
    Publication date: November 14, 2013
    Applicant: SOITEC
    Inventors: Nicolas Daix, Konstantin Bourdelle