Abstract: A spectral imager, including: a photodetector including a plurality of photosensitive sites exposed on a photosensitive surface; a collimating lens including an intermediate focal plane; an array of interferometers including two main waves, each including a cavity defined by two faces; an array of microlenses arranged in a plane parallel to the photosensitive surface, each microlens paired with an interferometer to form an optical pair, including an image focal plane coinciding with the photosensitive surface and facing a section of the photosensitive surface.

Abstract: A chip card manufacturing method. A module includes a substrate supporting contacts on one surface and conductive paths and a chip on another; and an antenna on a holder, the antenna including a contact pad for respectively connecting to each of the ends thereof. A solder drop is placed on each of the contact pads of the antenna. The holder of the antenna is inserted between plastic layers. A cavity is provided, in which the module can be accommodated and the solder drops remain accessible. The height of the solder drops before heating is suitable for projecting into the cavity. A module is placed in each cavity. The areas of the module that are located on the solder drops are heated to melt the solder and to solder the contact pads of the antenna to conductive paths of the module.

Abstract: A spectral imager, including: a photodetector including a plurality of photosensitive sites exposed on a photosensitive surface; a collimating lens including an intermediate focal plane; an array of interferometers including two main waves, each including a cavity defined by two faces; an array of microlenses arranged in a plane parallel to the photosensitive surface, each microlens paired with an interferometer to form an optical pair, including an image focal plane coinciding with the photosensitive surface and facing a section of the photosensitive surface.

Abstract: Some embodiments are directed to a wide-field imaging system for the infrared spectral range. The system can include a vacuum chamber that is optically open for the passage of the field rays originating from the scene to be imaged, a cooled dark chamber placed inside the vacuum chamber and provided with a cold diaphragm, an infrared detector placed inside the cooled dark chamber, and a device for optically conjugating the field rays with the detector.

Abstract: Some embodiments are directed to a wide-field imaging system for the infrared spectral range. The system can include a vacuum chamber that is optically open for the passage of the field rays originating from the scene to be imaged, a cooled dark chamber placed inside the vacuum chamber and provided with a cold diaphragm, an infrared detector placed inside the cooled dark chamber, and a device for optically conjugating the field rays with the detector.

Abstract: A chip card manufacturing method. A module includes a substrate supporting contacts on one surface and conductive paths and a chip on another; and an antenna on a holder, the antenna including a contact pad for respectively connecting to each of the ends thereof. A solder drop is placed on each of the contact pads of the antenna. The holder of the antenna is inserted between plastic layers. A cavity is provided, in which the module can be accommodated and the solder drops remain accessible. The height of the solder drops before heating is suitable for projecting into the cavity. A module is placed in each cavity. The areas of the module that are located on the solder drops are heated to melt the solder and to solder the contact pads of the antenna to conductive paths of the module.

Abstract: A method for range imaging allows determining respective distances to multiple objects, based on a single image. The image is captured through a component having a transmittance function of which the Fourier transform is inscribed on a circle within a plane of spatial frequencies. A Fourier transform of the captured image is calculated in order to obtain a total spectrum for the image content. The distance to each object is then calculated based on several homothetic superimpositions of a reference spectrum with the total spectrum, so that said reference spectrum coincides with a portion of the total spectrum each time.

Abstract: A micro-machined optical measuring device including: a set of photosensitive detector elements situated on a given face of a first support; a second support, assembled to the first support, forming a prism and including a first face through which a visible radiation is intended to penetrate and a second face, forming a non-zero angle ? with the first face and a non-zero angle ? with the given face of the first support, the second face being semi-reflective, the first support and the second support being positioned such that an interferometric cavity is made between the second face and the given face, the distance between the given face of the first support and the second face of the second support varying regularly.

Abstract: A method for range imaging allows determining respective distances to multiple objects, based on a single image. The image is captured through a component having a transmittance function of which the Fourier transform is inscribed on a circle within a plane of spatial frequencies. A Fourier transform of the captured image is calculated in order to obtain a total spectrum for the image content. The distance to each object is then calculated based on several homothetic superimpositions of a reference spectrum with the total spectrum, so that said reference spectrum coincides with a portion of the total spectrum each time.

Abstract: The application relates to a method for analyzing the wave surface of a light beam from a source to the focus of a lens. The beam illuminates a sample on the analysis plane and having a defect. A diffraction grating of the plane is a conjugate of an analysis plane through a focal system. An image is formed in a plane at a distance from the grating plane and analyzed by processing means. The invention encodes this grating by a phase function resulting from the multiplication of two phase functions, a first exclusion function defining a meshing of useful zones transmitting the beam to be analyzed in the form of light pencil beams, and a second phase fundamental function which creates a phase opposition between two light pencil beams coming out of adjacent meshes of the exclusion grating.

Abstract: A micro-machined optical measuring device including: a set of photosensitive detector elements situated on a given face of a first support; a second support, assembled to the first support, forming a prism and including a first face through which a visible radiation is intended to penetrate and a second face, forming a non-zero angle ? with the first face and a non-zero angle ? with the given face of the first support, the second face being semi-reflective, the first support and the second support being positioned such that an interferometric cavity is made between the second face and the given face, the distance between the given face of the first support and the second face of the second support varying regularly.

Abstract: The present disclosure relates to a compact wide field imaging system for the infrared spectrum range, the system including a vacuum housing with a porthole, a cooled dark room arranged inside the vacuum housing and provided with an opening referred to as a cold diaphragm, an infrared detector arranged inside the cooled dark room, and a device for the optical conjugation of the field rays with the detector. In the system, the optical conjugation device does not include any element located outside the vacuum housing, and includes at least one cold lens located inside the cooled dark room, the pupil of the optical conjugation device coinciding with the cold diaphragm.

Abstract: The method comprises positioning a diffraction grating with a two-dimensional meshing on the path of the beam to be analyzed and processing at least two interferograms of at least two different colors, each interferogram being obtained in a plane from two sub-beams with different diffraction orders. The invention can be used to analyze and correct divided wavefronts.

Abstract: A method and a system for analyzing the wavefront of a light beam, wherein a diffraction grating is arranged in a plane perpendicular to the light beam to be analyzed and optically conjugated to the analysis plane. Different emerging beams of the grating interfere to generate an image having deformations linked to the gradients of the wavefront to be analyzed. The method is characterized in that the grating carries out the multiplication of an intensity function which is implemented by a two-dimensional grating with hexagonal meshing of surface S transmitting the light of the beam to be analyzed into plural emerging beams arranged in a hexagonal meshing, by an phase function which is implemented by a two-dimensional grating with hexagonal meshing of surface 3S which introduces a phase shift close to 2?/3 (modulo 2?) between two adjacent secondary beams.

Abstract: The application relates to a method for analyzing the wave surface of a light beam from a source to the focus of a lens. The beam illuminates a sample on the analysis plane and having a defect. A diffraction grating of the plane is a conjugate of an analysis plane through a focal system. An image is formed in a plane at a distance from the grating plane and analyzed by processing means. The invention encodes this grating by a phase function resulting from the multiplication of two phase functions, a first exclusion function defining a meshing of useful zones transmitting the beam to be analyzed in the form of light pencil beams, and a second phase fundamental function which creates a phase opposition between two light pencil beams coming out of adjacent meshes of the exclusion grating.

Abstract: A method and a system for analyzing the wavefront of a light beam, wherein a diffraction grating is arranged in a plane perpendicular to the light beam to be analyzed and optically conjugated to the analysis plane. Different emerging beams of the grating interfere to generate an image having deformations linked to the gradients of the wavefront to be analyzed. The method is characterized in that the grating carries out the multiplication of an intensity function which is implemented by a two-dimensional grating with hexagonal meshing of surface S transmitting the light of the beam to be analyzed into plural emerging beams arranged in a hexagonal meshing, by an phase function which is implemented by a two-dimensional grating with hexagonal meshing of surface 3S which introduces a phase shift close to 2?/3 (modulo 2?) between two adjacent secondary beams.

Abstract: The method comprises positioning a diffraction grating with a two-dimensional meshing on the path of the beam to be analyzed and processing at least two interferograms of at least two different colors, each interferogram being obtained in a plane from two sub-beams with different diffraction orders. The invention can be used to analyze and correct divided wavefronts.

Abstract: The invention aims to integrate a two-wave stationary interferometer on a photodetector during fabrication in order to constitute a miniature stationary Fourier transform spectrometer. The interferometer essentially comprises a plate having a first plane face coinciding with an image plane on semiconductor photosensitive elements and a second face that is not parallel to the first face. The second face reflects a wave that has a phase difference relative to the incident wave interfering with it that is a function of the local thickness of the plate.

Abstract: The invention aims to integrate a two-wave stationary interferometer on a photodetector during fabrication in order to constitute a miniature stationary Fourier transform spectrometer. The interferometer essentially comprises a plate having a first plane face coinciding with an image plane on semiconductor photosensitive elements and a second face that is not parallel to the first face. The second face reflects a wave that has a phase difference relative to the incident wave interfering with it that is a function of the local thickness of the plate.

Abstract: In a process for analyzing the wavefront of a light beam, a diffraction grating with rectangular meshing is placed in a plane perpendicular to the light beam to be analyzed and optically conjugate with the analysis plane. Different emergent beams from the grating interfere to form an image whose deformations are related to the slopes of the wavefront analyzed. The grating multiplies an intensity function, implemented by a two-dimensional intensity grating, which defines a rectangular meshing of sub-pupils transmitting the light from the beam to be analyzed into a plurality of emergent beams disposed in accordance with a rectangular meshing, with a phase function implemented by a two-dimension phase grating which introduces a phase shift between two adjacent emergent beams such that the two emergent beams are in phase opposition.