Patents by Inventor Nicolas Longo

Nicolas Longo has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20230040619
    Abstract: A method for analysing the quality of a weld bead in a welding zone using a thermal camera. A thermal image (IMG) of a given area is divided into a plurality of sub-areas each having a respective temperature (Ti). During a learning step, the temperature evolution (Ti(t)) of each sub-area is monitored for different welding conditions. During a training step, the temperature evolutions (Ti(t)) are processed for training a classifier (304). For this purpose, a respective cooling curve is extracted (302) from each temperature evolution (Ti(t)), and parameters (F) are determined that identify the shape of each cooling curve. The parameters (F) are used as input features for the classifier (304). In normal operation the temperature evolution (Ti(t)) of each sub-area (Ai) is monitored and the classifier (304) estimates weld quality (S).
    Type: Application
    Filed: January 27, 2020
    Publication date: February 9, 2023
    Inventors: Giovanni Di Stefano, Nicola Longo
  • Publication number: 20190340762
    Abstract: A method of monitoring skin abnormalities on a skin portion of a patient includes the steps of: receiving a first image data from an image capture device, wherein the first image data includes the first skin portion; identifying a first skin mask corresponding to the first skin portion; identifying one or more first keypoints within the first skin mask, wherein each first keypoint comprises an abnormality on a first body region within the first skin portion; receiving a second image data from an image capture device, wherein the second image data includes a second body region within a second skin portion, and wherein the first and second image data are sequentially captured; and comparing the first and second body regions of the first and second image data to match the skin mask of the first and second image data.
    Type: Application
    Filed: July 16, 2019
    Publication date: November 7, 2019
    Inventors: Jean-Christophe Lapiere, Nicolas Longo, Christopher Billman, Kyoko Crawford, Charles McGrath, Nathan Tornquist, He Zhao
  • Patent number: 10354383
    Abstract: A method of monitoring skin abnormalities on a skin portion of a patient including the steps of receiving a first image data from an image capture device and identifying a first skin mask corresponding to the skin portion. The image data includes the skin portion and a first scaling element on the skin portion. The method further includes the steps of identifying one or more first keypoints within the first skin mask and classifying the one or more keypoints. Each first keypoint comprises an abnormality on the skin portion.
    Type: Grant
    Filed: October 5, 2017
    Date of Patent: July 16, 2019
    Assignee: SkinIO, LLC
    Inventors: Jean-Christophe Lapiere, Nicolas Longo, Christopher Billman, Kyoko Crawford, Charles McGrath, Nathan Tornquist, He Zhao
  • Publication number: 20180189949
    Abstract: A method of monitoring skin abnormalities on a skin portion of a patient including the steps of receiving a first image data from an image capture device and identifying a first skin mask corresponding to the skin portion. The image data includes the skin portion and a first scaling element on the skin portion. The method further includes the steps of identifying one or more first keypoints within the first skin mask and classifying the one or more keypoints. Each first keypoint comprises an abnormality on the skin portion.
    Type: Application
    Filed: October 5, 2017
    Publication date: July 5, 2018
    Inventors: Jean-Christophe Lapiere, Nicolas Longo, Christopher Billman, Kyoko Crawford, Charles McGrath, Nathan Tornquist, He Zhao