Abstract: A computer for a vehicle, the vehicle including a heat engine, a depollution system configured to depollute the exhaust gases originating from the engine, a first probe placed between the outlet of the heat engine and the inlet of the depollution system and configured to measure a first parameter relating to the oxygen level in the exhaust gases exiting the heat engine, a second probe placed at the outlet of the depollution system and configured to measure a second parameter relating to the oxygen level in the exhaust gases exiting the depollution system. The computer being configured to receive the values measured by the first probe and by the second probe over a predefined measurement time interval and to diagnose clogging of the first probe.

Abstract: A method for estimating the aging of an electronic component, characterized in that it includes the following steps: —compiling a thermal specification of the electronic component in order to determine a reference lifetime, —determining a reference temperature quantity, —measuring the actual temperature of the electronic component in operation, —determining an actual temperature quantity, —determining an equivalent operating time at the actual temperature, —transposing this equivalent operating time to the reference temperature to obtain a transposed operating time, —summing the transposed operating times to obtain a consumed lifetime comparable to the reference lifetime.

Abstract: A computer for a vehicle, the vehicle including a heat engine, a depollution system configured to depollute the exhaust gases originating from the engine, a first probe placed between the outlet of the heat engine and the inlet of the depollution system and configured to measure a first parameter relating to the oxygen level in the exhaust gases exiting the heat engine, a second probe placed at the outlet of the depollution system and configured to measure a second parameter relating to the oxygen level in the exhaust gases exiting the depollution system. The computer being configured to receive the values measured by the first probe and by the second probe over a predefined measurement time interval and to diagnose clogging of the first probe.

Abstract: A method for estimating the aging of an electronic component, characterized in that it includes the following steps: —compiling a thermal specification of the electronic component in order to determine a reference lifetime, —determining a reference temperature quantity, —measuring the actual temperature of the electronic component in operation, —determining an actual temperature quantity, —determining an equivalent operating time at the actual temperature, —transposing this equivalent operating time to the reference temperature to obtain a transposed operating time, —summing the transposed operating times to obtain a consumed lifetime comparable to the reference lifetime.