Patents by Inventor Nicolas SZAFRAN

Nicolas SZAFRAN has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11954848
    Abstract: The invention relates to a method and an installation for automatically measuring linear dimensions of manufactured objects (2) of a series comprising: the disposition of at least one focal point (Fj) of X-rays, on a same base straight line parallel to the rectilinear trajectory of displacement of the objects and of one or several image sensors (Ci); the acquisition, for each object during its displacement, of a set of one-dimensional images comprising, for a number (NK) of distinct section planes (Pk) containing the base straight line, a number (NP) of said images obtained along at least three different directions of projection (Dijk) in the section plane; for each object, and for each distinct section plane (Pk), the determination, from the images obtained, of a delineation of the object in the considered section plane (Pk).
    Type: Grant
    Filed: April 24, 2020
    Date of Patent: April 9, 2024
    Assignee: TIAMA
    Inventors: Olivier Colle, Benoit Cance, Laurent Cosneau, Laurent Desbat, Emanuel Maitre, Nicolas Szafran
  • Publication number: 20220237761
    Abstract: The invention relates to a method and an installation for automatically measuring linear dimensions of manufactured objects (2) of a series comprising: the disposition of at least one focal point (Fj) of X-rays, on a same base straight line parallel to the rectilinear trajectory of displacement of the objects and of one or several image sensors (Ci); the acquisition, for each object during its displacement, of a set of one-dimensional images comprising, for a number (NK) of distinct section planes (Pk) containing the base straight line, a number (NP) of said images obtained along at least three different directions of projection (Dijk) in the section plane; for each object, and for each distinct section plane (Pk), the determination, from the images obtained, of a delineation of the object in the considered section plane (Pk).
    Type: Application
    Filed: April 24, 2020
    Publication date: July 28, 2022
    Inventors: Olivier COLLE, Benoit CANCE, Laurent COSNEAU, Laurent DESBAT, Emanuel MAITRE, Nicolas SZAFRAN