Patents by Inventor Nicolas Vandeven

Nicolas Vandeven has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Assembly and method for measuing ionizing radiation with background noise correction
    Publication number: 20030004406
    Abstract: The noise originating from the ambient radiation is derived from the measurement of the radiation of a source (S) via a preliminary correlation calculated between the measurements of the main detector (1) and of at least one auxiliary detector (2): when the radiating source (S) is present, the auxiliary detector (2), which keeps on measuring the ambient radiation, is used to evaluate the proportion of the main detector (1) measurement which comes from the ambient radiation. This invention applies to the measurement of the activity of various objects proving a low radiation level.
    Type: Application
    Filed: August 1, 2002
    Publication date: January 2, 2003
    Inventors: Jean-Francois Pineau, Michel Janot, Nicolas Vandeven, Philippe Eydoux