Patents by Inventor Nicolas VAXELAIRE

Nicolas VAXELAIRE has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Device and method for determining an effective piezoelectric coefficient of a material
    Patent number: 11852667
    Abstract: A device for determining an effective piezoelectric coefficient of a thin film of a material of a sample, includes a source of x-rays incident on the sample; a detector of x-rays diffracted by the sample; a device for positioning the x-ray source and the x-ray detector with respect to the sample; a voltage source making contact with the sample; a device for controlling the voltage source so as to apply an electric field to the sample during an electrical cycle, the electric field generating a strain of the sample and a stress on the sample; a device for measuring a diffraction peak of the x-rays as a function of the electric field applied to the sample during the electrical cycle; a processing device configured to determine the piezoelectric coefficient.
    Type: Grant
    Filed: April 1, 2022
    Date of Patent: December 26, 2023
    Assignee: COMMISSARIAT A L'ENERGIE ATOMIQUE ET AUX ENERGIES ALTERNATIVES
    Inventor: Nicolas Vaxelaire
  • DEVICE AND METHOD FOR DETERMINING AN EFFECTIVE PIEZOELECTRIC COEFFICIENT OF A MATERIAL
    Publication number: 20220326291
    Abstract: A device for determining an effective piezoelectric coefficient of a thin film of a material of a sample, includes a source of x-rays incident on the sample; a detector of x-rays diffracted by the sample; a device for positioning the x-ray source and the x-ray detector with respect to the sample; a voltage source making contact with the sample; a device for controlling the voltage source so as to apply an electric field to the sample during an electrical cycle, the electric field generating a strain of the sample and a stress on the sample; a device for measuring a diffraction peak of the x-rays as a function of the electric field applied to the sample during the electrical cycle; a processing device configured to determine the piezoelectric coefficient.
    Type: Application
    Filed: April 1, 2022
    Publication date: October 13, 2022
    Inventor: Nicolas VAXELAIRE