Patents by Inventor Nicolas Vazquez

Nicolas Vazquez has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Pattern matching system and method with improved template image sampling using low discrepancy sequences
    Patent number: 6229921
    Abstract: A system and method for performing pattern matching to locate zero or more instances of a template image in a target image. The method first comprises sampling the template image using a Low Discrepancy sequence, also referred to as a quasi-random sequence, to determine a plurality of sample pixels in the template image which accurately characterize the template image. The Low Discrepancy sequence is designed to produce sample points which maximally avoid each other. After the template image is sampled or characterized, the method then performs pattern matching using the sample pixels and the target image to determine zero or more locations of the template image in the target image. The method may also perform a local stability analysis around at least a subset of the sample pixels to determine a lesser third number of sample pixels which have a desired degree of stability, and then perform pattern matching using the third plurality of sample pixels.
    Type: Grant
    Filed: January 6, 1999
    Date of Patent: May 8, 2001
    Assignee: National Instruments Corporation
    Inventors: Lothar Wenzel, Dinesh Nair, Nicolas Vazquez, Samson DeKey
  • Pattern matching system and method which detects rotated and scaled template images
    Patent number: 6222940
    Abstract: A system and method for performing pattern matching to locate zero or more instances of a template image in a target image. The method first comprises sampling the template image using a Low Discrepancy sequence, also referred to as a quasi-random sequence, to determine a plurality of sample pixels in the template image which accurately characterize the template image. The Low Discrepancy sequence is designed to produce sample points which maximally avoid each other. After the template image is sampled or characterized, the method then performs pattern matching using the sample pixels and the target image to determine zero or more locations of the template image in the target image. The method may also perform a local stability analysis around at least a subset of the sample pixels to determine a lesser third number of sample pixels which have a desired degree of stability, and then perform pattern matching using the third plurality of sample pixels.
    Type: Grant
    Filed: January 6, 1999
    Date of Patent: April 24, 2001
    Assignee: National Instruments Corporation
    Inventors: Lothar Wenzel, Dinesh Nair, Nicolas Vazquez, Samson Dekey
  • Pattern matching system and method which performs local stability analysis for improved efficiency
    Patent number: 6219452
    Abstract: A system and method for performing pattern matching to locate zero or more instances of a template image in a target image. The method first comprises sampling the template image using a Low Discrepancy sequence, also referred to as a quasi-random sequence, to determine a plurality of sample pixels in the template image which accurately characterize the template image. The Low Discrepancy sequence is designed to produce sample points which maximally avoid each other. After the template image is sampled or characterized, the method then performs pattern matching using the sample pixels and the target image to determine zero or more locations of the template image in the target image. The method may also perform a local stability analysis around at least a subset of the sample pixels to determine a lesser third number of sample pixels which have a desired degree of stability, and then perform pattern matching using the third plurality of sample pixels.
    Type: Grant
    Filed: January 6, 1999
    Date of Patent: April 17, 2001
    Assignee: National Instruments Corporation
    Inventors: Dinesh Nair, Lothar Wenzel, Nicolas Vazquez, Samson DeKey